Calibration of very close range digital cameras

• Autorzy: Bujakiewicz, A. , Kowalczyk, M. , Podlasiak, P. , Zawieska, D.

Warianty tytułu

PL

KaIibracja kamer cyfrowych bardzo bliskiego zasięgu

• Języki publikacji: EN

Abstrakty

EN

The paper discusses the problems of the calibration process of very close range semi-metric digital cameras. Using such cameras for precise measurement of small objects, the photographs have to be taken at a very large scale, ranging from 1 :20 to 1 :50. To ensure the submillimetre accuracy of the photogrammetric measurement, the specific calibration tests and procedures for determination of the interior orientation parameters, including the coefficients for image systematic errors, must be applied. The results of two calibration approaches, based on 3D and 2D calibration tests, have been presented in the paper. The experiment is a part of the research project concerning the numerical modelling of small 3D fragments of the broken archaeological items for reconstruction of the context of the archaeological monument.

PL

Artykuł dotyczy procesu kalibracji semi-metrycznych kamer cyfrowych. Stosując takie kamery do pomiaru małych obiektów, zdjęcia muszą być wykonane w bardzo dużej skali, w zakresie od około 1:20 do 1:50. W celu zapewnienia dokładności pomiaru fotogrametrycznego na poziomie poniżej pół milimetra, należy stosować specjalne procedury i testy kalibracyjne dla określenia parametrów orientacji wewnętrznej, łącznie ze współczynnikami opisującymi błędy systematyczne zdjęć. W niniejszym artykule, przedstawiono porównanie dwóch metod, bazujących na obrazach dwuwymiarowych i trójwymiarowych testów kalibracyjnych. Wykonany eksperyment jest częścią projektu badawczego, finansowanego przez KBN, który dotyczy numerycznego modelowania fragmentów rzeźb w celu rekonstrukcji oryginalnego kontekstu zabytku.

Słowa kluczowe

PL

fotogrametria; kartografia

EN

close range photogrammetry; semi-metric camera; calibration

• Czasopismo: Geodezja i Kartografia
• Rocznik: 2006
• Tom: Vol. 55, no 2
• Strony: 95-108
• Opis fizyczny: Bibliogr. 20 poz., rys., tab., wykr.

Twórcy

autor

Bujakiewicz, A.

autor

Kowalczyk, M.

autor

Podlasiak, P.

autor

Zawieska, D.

• Institute of Photogrammetry and Cartography Warsaw University of Technology I Plac Politechniki, 00-661 Warsaw, Poland,

Bibliografia

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