Measurement and statistical modeling of BRDF of various samples

• Autorzy: Zhang, H. , Wu, Z. , Cao, Y. , Zhang, G.
• Języki publikacji: EN

Abstrakty

EN

Based on the Torrance-Sparrow model, a modified and simplified five-parameter model is obtained. Multi-angle bistatic reflectance data of surfaces of various materials are fitted using this model. Genetic algorithm is used to optimize the parameters for the model. The results of the five-parameter model are in good agreement with experimental data which do not take part in fitting, and are close to the results of two-dimensional bidirectional reflectance distribution function (BRDF) models. The five-parameter model shows a good applicability to various rough surfaces with different surface optical properties. The five-parameter model can be used to construct a three-dimensional BRDF distribution based on the spatial experimental data, which may provide more information on light scattering from rough surfaces.

Słowa kluczowe

EN

bidirectional reflectance distribution function (BRDF); modeling; measurement; light scattering

• Czasopismo: Optica Applicata
• Rocznik: 2010
• Tom: Vol. 40, nr 1
• Strony: 197--208
• Opis fizyczny: Bibliogr. 31 poz.

Twórcy

autor

Zhang, H.

autor

Wu, Z.

autor

Cao, Y.

autor

Zhang, G.

• School of Sciences, Xidian University, Xi'an, Shaanxi, 710071, China

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