Magnetometry of monoatomic layers and spin electronics elements

• Autorzy: Wrona, J. , Stobiecki, T. , Czapkiewicz, M. , Rak, R.
• Języki publikacji: EN

Abstrakty

EN

In this paper, two magnetometers: resonance vibrating sample magnetometer (R-VSM) and magnetooptical Kerr effect magnetometer (MOKE) designed for hysteresis loop measurements of ultra-thin films and spintronics elements are described. Both instruments have been built by the first author of this paper in the Department of Electronics. The measuring head of R-VSM is universal and could work in the Helmholtz coils as well as in an electromagnet. The frequency of R-VSM is about 75 Hz. Test measurements on MgO(001)/Fe(4, 3, and 2ML)/50ACr samples were performed and the sensitivity was estimated as 10-5 emu. The MOKE system with differential amplifier (in contrast to lock-in detection technique) is especially recommended for rapid measurements up to 1.5 kHz. The calibration of the Kerr rotation angle was performed on the standard Fe sputtered films (with thickness from 2 nm to 50 nm) and Fe-wedge sample, prepared by MBE-technique, with the range of thickness from 1ML to 50 ML of Fe. On the base of measurement of 2, 3, 4, 5, 7 ML of Fe, the angle resolution of Kerr rotation was estimated as 0.001 min.

Słowa kluczowe

EN

magnetometry; vibration sample magnetometr; VSM; magnetooptical Kerr effect; MOKE; magnetic monoatomic layers; spin electronics

• Czasopismo: Materials Science
• Rocznik: 2003
• Tom: Vol. 21, No. 1
• Strony: 55-63
• Opis fizyczny: Bibliogr. 12 poz.

Twórcy

autor

Wrona, J.

• Department of Electronics, University of Mining and Metallurgy, Kraków, Poland,

autor

Stobiecki, T.

• Department of Electronics, University of Mining and Metallurgy, Kraków, Poland

autor

Czapkiewicz, M.

• Department of Electronics, University of Mining and Metallurgy, Kraków, Poland

autor

Rak, R.

• Department of Electronics, University of Mining and Metallurgy, Kraków, Poland

Bibliografia

• [1] Parkin S.S.P., Roche K.P., Samant M.G., Rice P.M., Beyers R.B., Scheuerlein R.E., O'Süllivan E.J., Brown S.L., Bucchigano J., Abraham D.W., Lu Yu, Rooks M., Trouilloud P.L., Waner R.A., Gallagher W.J., J. Appl. Phys., 85 (1999), 5828.
• [2] Tumański S., Thin Film Magnetoresistive Sensors, IOP Bristol and Philadelphia, 2001.
• [3] Song D., Nowak J., Larson R., Kolbo P., Chellew R., IEEE Trans. Magn., 36 (2000), 2545.
• [4] Wrona J., Czapkiewicz M., Stobiecki T., J. Magn. Magn. Mat., 196-197 (1999), 935.
• [5] Wrona J., Stobiecki T., Rak R., Czapkiewicz M., Stobiecki F., Uba L., Korecki J., Ślęzak T., Wilgocka-Ślęzak J., Rotts M., phys. stat. sol. (a), in press.
• [6] Foner S., Rev. Sei. Instr., 30 (1959), 548.
• [7] Pacyna A. W., J. Phys. E: Sei. Instram., 17 (1984), 141.
• [8] Wrona J., Magnetometry of thin film structures, PhD. Dissertation, University of Mining and Metallurgy, Kraków, 2002.
• [9] Zięba A., Foner S., Rev. Sei. Instrum., 53 (1982), 1344.
• [10] Smith D. O., Rev. Sei. Instr., 27 (1956), 261.
• [11] Postava K., Bobo J.F., Ortega M.D., Raquet B., Jaffres H., Snoeck E., Goiran M., Fert A.R., Redoules J.P., Pistora J., Ousset J.C., J. Magn. Magn. Mat., 163 (1996), 8.
• [12] Liu C., Bader S.D., J. Magn. Magn. Mat., 93 (1991), 307.