The sol-gel synthesis of bismuth titanate electroceramic thin films

• Autorzy: Zarycka, A. , Lisińska-Czekaj, A. , Czuber, J. , Orkisz, T. , Ilczuk, J. , Czekaj, D.
• Konferencja: Sol-Gel Materials Research, Technology, Applications SGM'04, 6-11 june 2004
• Języki publikacji: EN

Abstrakty

EN

The present study reports results of the synthesis of randomly oriented Bi4Ti3O12 (BTO) thin films by a modified hybrid sol-gel process. Bismuth nitrate and titanium(IV) butoxide were used as the starting materials. Crystalline films were deposited on silicon and stainless steel substrates by spin coating and subsequently annealed at 650 0C. The structure of the films was investigated by X-ray diffraction. The formation of a layered perovskite-like structure with orthorhombic symmetry was confirmed. Scanning electron microscopy showed that the surfaces of the films were smooth, dense, and crack free. Conservation of the chemical composition was confirmed by energy dispersive spectroscopy.

Słowa kluczowe

EN

Bi4Ti3O12; ferroelectric thin films; sol-gel method; X-ray studies

• Czasopismo: Materials Science Poland
• Rocznik: 2005
• Tom: Vol. 23, No. 1
• Strony: 167--175
• Opis fizyczny: Bibliogr. 16 poz.

Twórcy

autor

Zarycka, A.

• University of Silesia, Department of Materials Science, ul. Śnieżna 2, 41-200 Sosnowiec, Poland,

autor

Lisińska-Czekaj, A.

• University of Silesia, Department of Materials Science, ul. Śnieżna 2, 41-200 Sosnowiec, Poland

autor

Czuber, J.

• University of Silesia, Department of Materials Science, ul. Śnieżna 2, 41-200 Sosnowiec, Poland

autor

Orkisz, T.

• University of Silesia, Department of Materials Science, ul. Śnieżna 2, 41-200 Sosnowiec, Poland

autor

Ilczuk, J.

• University of Silesia, Department of Materials Science, ul. Śnieżna 2, 41-200 Sosnowiec, Poland

autor

Czekaj, D.

• University of Silesia, Department of Materials Science, ul. Śnieżna 2, 41-200 Sosnowiec, Poland

Bibliografia

• [1] CZEKAJ D., Technology Properties and Applications of PZT Thin Films, Wyd. Uniw. Śl., Katowice, 2002.
• [2] SUROWIAK Z., GEGUZINA G., FESENKO E., LISIŃSKA A., SHUVAEVA E., Polish J. Appl. Chem., 38 (1994), 3.
• [3] SUBBARAO E.C., Phys.Rev., 122 (1961), 804.
• [4] AURIVILLIUS B., Arkiv Kemi, 1 (1950), 499.
• [5] CUMMINS S. E., CROSS L. E. J. Appl. Phys., 39 (1968), 2268.
• [6] JIN SOO KIM, SANG SU KIM, JONG KUK KIM, TAE KWON SONG, Jpn. J. Appl. Phys., 41 (2002), 6451.
• [7] ARAUJO E.B., NUNES V.B., ZANETTE S.I., EIRAS J.A., Mat. Lett.,49 (2001) 108.
• [8] KONG L.B., MA J., Thin Solid Films, 379 (2000), 89.
• [9] MOROZOV M. I.,MEZENTSEVA L. P., GUSAROV V. V., Russian J. Gen. Chem., 72, (2002), 1038.
• [10] ARAUJO E. B., EIRAS J. A., J. Eur. Ceram. Soc., 19 (1999), 1453.
• [11] SEDLAR M., SAYER M., Ceramics Int., 22 (1996), 241.
• [12] RAE A.D., THOMPSON, J.G.,WITHERS R.L.,WILLIS A.C., Acta Cryst., B46 (1990), 474.
• [13] CHU M.-W., CALDES M.T., PIFFARD Y., MARIE A.-M., GAUTIER E., JOUBERT O., GANNE M., BROHAN L., J. Sol. State Chem., 172 (2003), 389.
• [14] The Rietveld Method, R.A. Young (Ed)., Oxford University Press, Oxford, 1995.
• [15] NOLZE G., KRAUS W., Powder Diffraction, 13, (1998), 256.
• [16] DORRIAN J.I., NEWHAM R.E., SMITH D.K., Ferroelectrics, 3 (1971), 17.