Czasopismo
2000
|
Vol. 30, nr 4
|
543-551
Tytuł artykułu
Autorzy
Wybrane pełne teksty z tego czasopisma
Warianty tytułu
Języki publikacji
Abstrakty
Presents results obtained by the application of the method of thermally stimulated depolarization (TSD) to investigate dipole relaxation in SiO/sub 2/ xerogels. The presence of a strong temperature gradient in the sample has been revealed during measurements of the TSD current. The paper describes the method of determination of activation energy W, initial polarization P/sub 0/ and factor tau /sub 0/, for the dipole relaxation processes under investigation. It has been shown that the modified TSD method is a sensitive tool for the investigation of changes taking place in the peripheral molecular layer on the surface of pores in SiO/sub 2/ xerogels.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
543-551
Opis fizyczny
Bibliogr. 20 poz., rys. 6, tab. 1
Twórcy
autor
autor
- Faculty of. Applied Physics and Mathematics, Technical University of Gdańsk, ul. G. Narutowicza 11/12, 80-952 Gdańsk, Poland.
Bibliografia
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW3-0008-0042