Czasopismo
2002
|
Vol. 32, nr 3
|
517-522
Tytuł artykułu
Autorzy
Wybrane pełne teksty z tego czasopisma
Warianty tytułu
Języki publikacji
Abstrakty
The performance of p-i-n infrared detectors has been studied theoretically. Optimization of InxGa1–xAs device structure has been performed for three compositions, x = 0.53, x = 0.82 and x = 1, which are important from the application point of view. Calculations have been performed by means of APSYS simulation program and the model based on fundamental limitations to the detector operation. The influence of layer thickness, as well as doping concentration in the active layer on zero bias resistance and detectivity of devices optimized for desired cut-off wavelength have been discussed. Additionally, the photovoltaic effect across the structure has been discussed. Finally, the influence of the ohmic contact position on photodiode parameters has been shown.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
517-522
Opis fizyczny
bibliogr. 13 poz.
Twórcy
autor
autor
- Warsaw University of Technology, ul. Koszykowa 75, 06-662 Warszawa
Bibliografia
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW1-0013-0077