Building a new software of electromagnetic lenses (CADTEL)

• Autorzy: Hasan, H.S.
• Języki publikacji: EN

Abstrakty

EN

The Computer Aided designing Tools for Electromagnetic Lenses (CADTEL) is a new software as application package of programs concept to aid both users and professionals in symmetric and asymmetric electromagnetic lenses with single, double, and multipole piece in electron microscope of electron optics field. The CADTEL software has been designed to run on several computer platforms and includes two types of design procedure. The first one named, analysis procedure (which is based on trial and error) where consist of three sorts called; H1 programs for magnetic scalar potential by solving Laplace's equation [1, 2], H2 and H3 programs for magnetic vector potential by solving Poisson's equation [3, 4] in linear and non linear media respectively. While the second part, named H4 programs for the synthesis procedure (inverse design). The previous types differ by the obtaining the magnetic flux density, and poles shape, while it is analog by compute and plot the lens properties which are operating at zero, low, high, and infinite magnification conditions (operation modes). CADTEL software consist of computational and plot steps of magnetic field, equipotential surfaces, flux lines, objective and projector properties, and poles shape for proposed lens design which are appear in auto visual interfaces, that are coded in visual basic language [5].

Słowa kluczowe

EN

Electron lenses; Objective and projector properties; Lenses aberrations; Electron optics; Charged particle optics; Software and simulation in electron lenses

• Czasopismo: International Letters of Chemistry, Physics and Astronomy
• Rocznik: 2013
• Tom: Vol. 4
• Strony: 46-55
• Opis fizyczny: Bibliogr. 23 poz., rys.

Twórcy

autor

Hasan, H.S.

• Department of Physiology and Medical Physics, College of Medicine, Al-Nahrain University, Baghdad, Iraq,

Bibliografia

• [1] H. H. Rose, Geometrical Charged-Particle Optics, Springer Series in Optical Sciences, 2009.
• [2] S. I. Molokovsky, Intense Electron and Ion Beams, Springer-Verlag Berlin Heidelberg, 2005.
• [3] A. Zhigarev, Electron Optics and Electron Beam-Devices, (Mir. Publisher: Moscow), 1975.
• [4] M. Reiser, Theory and Design of Charged Particle Beams, WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2004.
• [5] E. Petroutsos, MasteringTM Visual Basic® 6, © SYBEX Inc. U.S.A, 1998.
• [6] B. Lencova, Software for Particle Optics Computations SPOC, Fleischnerova 15, 63500 Brno, Czech Republic, 2000.
• [7] Sh. Fujita, M. Takebe, H. Shimoyama, G-Optk: Simulation Software for Electron Gun Characterization", Seventh International Conference on Charged Particle Optics (CPO-7), Abstract for Computer Software Demonstrations, Trinity College Junior Parlour, 2006.
• [8] B. Lencová, J. Zlámal, Microscopy and Microanalysis 13 (3) (2007) 2-3.
• [9] H. Müller, S. Uhlemann, P. Hartel, M. Haider, "Aberration-Corrected Optics: From an idea to a device", Proceeding of CPO-7, Eds. E. Munro and J. Rose, Physics Procedia 1(1), (2008) 167-178.
• [10] A. A. Trubitsyn, Applied Physics (Rus.) 2 (2008) 56-62.
• [11] D. A. Dahl, Int. J. Mass Spectrom. 200 (2000) 3-25.
• [12] D. Manura, "SIMION ® 8.0 User Manual", Scientific Instrument Service (SIS), Inc., issue 172, USA, 2008.
• [13] T. Huang, Q. Hu, Z. Yang, B. Li, J. Q. Li, X. L. Jin, Y. L. Hu, X. F. Zhu, L. Liao, L. Xiao, G. X. He, Electron Devices, IEEE Transactions on 56(1), (2009) 140-148
• [14] E. Munro, Munro's Electron Beam Software – Software Catalogue, MEBS Ltd, 2010.
• [15] S. Humphries, Three-dimensional Charged-particle Optics and Gun Design, Field Precision LLC, CRC Press, Albuquerque, New Mexico U.S.A, 2011.
• [16] E. Munro, A Set of Computer Programs for Calculating of Properties Electron Lenses, Univ. of Cambridge, Depart. Of Eng. Report CUED/B- Elect. TR 45, 1975.
• [17] R. F. Egerton, Physical Principles of Electron Microscopy , Springer, USA, 2005.
• [18] M. Szilagyi, Electron and Ion Optics, Plenum Press: New York, 1988.
• [19] P. W. Hawkes, Magnetic Electron Lenses, Springer-Verlag, Berlin, 1982.
• [20] M. Kato, K. Tsuno, IEEE Transaction on Magnetic 26 (1990) 1023-1025.
• [21] A. B. El-Kareh, J. C. J. El-Kareh, Electron Beams Lenses and Optics, vol.1 and 2, (Academic Press: New York and London), 1970.
• [22] K. Tsuno, Y. Harada, J. Phys. E: Sci. Inst. 14 (1981a) 313-319.
• [23] K. Tsuno, Y. Harada, J. Phys. E: Sci. Inst. 14 (1981b) 955-960.