Complex X-ray study of effects of mechanical surface treatment in shot-peened steels

• Autorzy: Ganev, N. , Skrzypek, S. J. , Sedlák, P.

Warianty tytułu

PL

Kompleksowe rentgenowskie badania strukturalne nad wpływem mechanicznej obróbki powierzchni przez śrutowanie

• Konferencja: Advanced Materials and Technologies, AMT'2004 : XVII Physical Metallurgy and Materials Science Conference (XVII; 20-24.06.2004; Łódź, Polska)
• Języki publikacji: EN

Abstrakty

EN

Beneficial residual stress (RS) level and strain hardening are very important properties of surface layers obtained after shot penning. Both characteristic features have non-uniform distribution and their description is important for defining the achieved surface layers. The level and sign of residual stresses are influential parameters for mechanical properties of materials and for the structural behaviour of machine parts during external loading and exploitation. The aim of the contribution is to present acomparative X-ray diffraction analysis of residual stresses in shot-peened steel samples. Contemporaneous application of two experimental approaches, i.e. classical sin^2psi technique for depth profile stress determination (Czech Technical University in Prague) and modified g-sin^2psi method (AGH-University of Science and Technology, Cracow) provides complex structural characterisation of surface layers. The results obtained in both cooperating X-ray diffraction laboratories are in a good agreement and show promise.

Słowa kluczowe

PL

badania rentgenowskie; obróbka mechaniczna; obróbka powierzchni; śrutowanie

• Czasopismo: Inżynieria Materiałowa
• Rocznik: 2004
• Tom: R. XXV, nr 3
• Strony: 576-578
• Opis fizyczny: Bibliogr. 6 poz., tab., rys.

Twórcy

autor

Ganev, N.

• Czech Technical Uniyersity in Prague, Czech Republic

autor

Skrzypek, S. J.

• AGH-University of Science and Technology, Cracow

autor

Sedlák, P.

• Czech Technical Uniyersity in Prague, Czech Republic

• AGH-University of Science and Technology, Cracow

Bibliografia

• [1] Noyan I. C., Cohen J. B.: Residual Stresses, Springer - Verlag, New York 1987
• [2] Kraus I., Ganev N.: Residual Stress and Stress Gradients, In Industrial Applications of X-ray Diffraction, Eds. F.H.Chung and D. K. Smith, Marcel Dekker, Inc., New York-Basel, 2000; pp. 793-811
• [3] Kraus L, Ganev N.: X-ray analysis of the inhomogenous stress state, In: Defects and Microstructure Analysis by Diffraction, Eds. R.L.Snyder, J.Fiala and H.J.Bunge, Oxford University Press Inc., New York, 1999; 367-401
• [4] Van Acker K., De Buyser L., Celis J.P., YanHoutte P. Characterization of Thin Nickel Electrocoatings by the Low-Incident- Beam-Angle Diffraction Method. J. Appl. Cryst, 27, 1994, 56-66
• [5] Skrzypek S.J., Baczmański A, Ratuszek W., Kusior E.: New Method for Stress Analysis Based on Grazing Incident Angle X-Ray Diffraction. J. of Appl. Cryst., 34, 2001, 427-435
• [6] Skrzypek S.J.: Nowe możliwości pomiaru makro-naprężeń własnych w materiałach przy zastosowaniu dyfrakcji promieniowania X w geometrii stałego kąta padania, ROZPRAWY i MONOGRAFIE 108, Uczelniane Wyd. Nauk.-Dydaktyczne AGH, Kraków 2002