Quantitative characterisation of alumina scales on high temperature alloys by atomic force microscopy.

• Autorzy: Czyrska-Filemonowicz, A. , Szot, K. , Wasilkowska, A. , Breuer, U. , Quadakkers, W.J.
• Konferencja: AMT'98 XVth Physical Metallurgy and Materials Science Conference 'Advanced Materials & Technologies', 17-21 May, 1998, Kraków-Krynica, Poland
• Języki publikacji: EN

Abstrakty

EN

The formation of thin oxide films on {111} and {110} single crystal specimens of the Fe20Cr5Al based ODS alloy during the early stages of oxidation at temperatures up to 1000 degrees centigrade was quantitatively investigated by atomic force microscopy (AFM). The AFM results revealed the crystalline character of corrosion layer. The alumina scale morphology (height and grain size of crystallites) was slightly dependent on the crystallographic texture of the underlying bulk material. The results showed that AFM is promising technique for the quantitative characterization of the surface structure of oxide layers in the initial stages of oxidation processes.

Słowa kluczowe

PL

tlenek glinu; stop żarowytrzymały; monokryształ; cienka warstwa; powłoka tlenkowa; korozja; krystalit; mikroskopia sił atomowych

EN

alumina; high temperature alloy; single crystal; thin film; oxide film; corrosion; crystallite; atomic force microscopy (AFM)

• Czasopismo: Inżynieria Materiałowa
• Rocznik: 1998
• Tom: R. XIX, nr 4
• Strony: 1141-1146
• Opis fizyczny: Bibliogr. 4 poz., tab., rys.

Twórcy

autor

Czyrska-Filemonowicz, A.

• University of Mining and Metallurgy, Faculty of Metallurgy and Materials Science, Kraków, Poland

autor

Szot, K.

• Silesian University, Faculty of Physics, Katowice, Poland

autor

Wasilkowska, A.

• University of Mining and Metallurgy, Faculty of Metallurgy and Materials Science, Kraków, Poland

autor

Breuer, U.

• Research Centre Jülich, Jülich, Germany

autor

Quadakkers, W.J.

• Research Centre Jülich, Jülich, Germany

• University of Mining and Metallurgy, Faculty of Metallurgy and Materials Science, Kraków

Bibliografia

• [1] B. Dubiel, W. Osuch, M. Wróbel, P. J. Ennis, A. Czyrska-Filemonowicz, Journal of Materials Processing Technology, 53 (1995) 121.
• [2] R. Wiesendanger in: Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, 1994.
• [3] A.Czyrska-Filemonowicz, K.Szot, A. Wasilkowska, A. Gil, W. J. Quadakkers, Solid State Ionics, in press.
• [4] A. Czyrska-Filemonowicz, D. Clemens, W. J. Quadakkers, Metallurgy and Foundry Engineering, 21(1995) 319.