Czasopismo
2017
|
Vol. 35, No. 1
|
87--93
Tytuł artykułu
Autorzy
Wybrane pełne teksty z tego czasopisma
Warianty tytułu
Języki publikacji
Abstrakty
Bismuth oxide thin film was deposited by chemical bath deposition (CBD) technique onto a glass substrate. The grain size (D), dislocation density (δ) and number of crystallites per unit area (N), i.e. structural properties of the thin film were determined as 16 nm, 39.06 x 10-4 line/nm2, 31.25 x 10-3 1/nm2, respectively. Optical transmittance properties of the thin film were investigated by using a UV-Vis spectrophotometer. The optical band gap (Eg) for direct transitions, optical transmission (T %), reflectivity (R %), absorption, refractive index (nr), extinction coefficient (k), dielectric constant (ϵ) of the thin film were found to be 3.77 eV, 25.23 %, 32.25 %, 0.59, 3.62, 0.04 and 2.80, respectively. The thickness of the film was measured by AFM, and was found to be 128 nm. Contact angles of various liquids on the oxide thin film were determined by Zisman method, and surface tension was calculated to be 31.95 mN/m.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
87--93
Opis fizyczny
Bibliogr. 35 poz., rys., tab.
Twórcy
autor
- Department of Metallurgy and Materials Engineering, Faculty of Engineering, Karabuk University, 78050, Karabuk, Turkey, meydaneri@yahoo.com
autor
- Department of Science Education, Education Faculty, Erciyes University, 38039, Kayseri, Turkey
Bibliografia
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Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-8c0f2f54-a928-4831-80bf-b5d0c58e1689