Structural and optical properties of TiO2 thin films grown by sol-gel dip coating process

• Autorzy: Bouachiba, Y. , Bouabellou, A. , Hanini, F. , Kermiche, F. , Taabouche, A. , Boukheddaden, K.
• Języki publikacji: EN

Abstrakty

EN

The mono and bi-layer TiO2 thin films have been prepared by sol-gel method on glass. X-Ray diffraction, Raman spectroscopy, atomic force microscopy, spectroscopic ellipsometry and m-lines spectroscopy techniques have been used to characterize the TiO2 films. The mono-layer film is found to be amorphous, while the bi-layer film shows the presence of anatase phase. The bi-layer film exhibits more homogeneous surface with less roughness. The thickness effect on the refractive index, extinction ceofficient, packing density and optical band gap is analysed. The waveguiding measurements of the bi-layer film exhibit single-guided TE0 and TM0 polarized modes from which we can measure the refractive index and the film thickness.

Słowa kluczowe

EN

TiO2; anatase; AFM; ellipsometry; m-lines

• Czasopismo: Materials Science Poland
• Rocznik: 2014
• Tom: Vol. 32, No. 1
• Strony: 1--6
• Opis fizyczny: Bibliogr. 29 poz., rys., tab., wykr.

Twórcy

autor

Bouachiba, Y.

• Laboratoire Couches Minces et Interfaces, Université Constantine 1, Constantine 25000, Algérie

autor

Bouabellou, A.

• Laboratoire Couches Minces et Interfaces, Université Constantine 1, Constantine 25000, Algérie

autor

Hanini, F.

• Laboratoire Couches Minces et Interfaces, Université Constantine 1, Constantine 25000, Algérie

autor

Kermiche, F.

• Laboratoire Couches Minces et Interfaces, Université Constantine 1, Constantine 25000, Algérie

autor

Taabouche, A.

• Laboratoire Couches Minces et Interfaces, Université Constantine 1, Constantine 25000, Algérie

autor

Boukheddaden, K.

• Groupe d’Etude de la Maticre Condensée, CNRS-Université de Versailles/St. Quentin en Yvlines, ˇ45 Avenue des Etats Unis F78035 Versailles Cedex, France

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Identyfikatory

DOI

10.2478/s13536-013-0147-z