Warianty tytułu
Języki publikacji
Abstrakty
CdS and Zn-doped CdS (CdS:Zn) thin films have been deposited on glass substrates by spray pyrolysis technique using a perfume atomizer. The influence of Zn incorporation on the structural, morphological, optical and electrical properties of the films has been studied. All the films exhibit hexagonal phase with (0 0 2) as preferential orientation. A shift of the (0 0 2) diffraction peak towards higher diffraction angle is observed with increased Zn doping. The optical studies confirmed that the transparency increases as Zn doping level increases and the film coated with 2 at.% Zn doping has the maximum transmittance of about 90 %. The sheet resistance (Rsh) decreases as the Zn-doping level increases and a minimum value of 1.113 × 103 Ω/sq is obtained for the film coated with 8 at.% Zn dopant. The CdS film coated with 8 at.% Zn dopant has the best structural, morphological and electrical properties.
Czasopismo
Rocznik
Tom
Strony
652--660
Opis fizyczny
Bibliogr. 33 poz., rys., tab.
Twórcy
autor
- PG and Research Department of Physics, AVVM Sri Pushpam College, Poondi – 613 503, Tamilnadu, India
autor
- PG and Research Department of Physics, AVVM Sri Pushpam College, Poondi – 613 503, Tamilnadu, India
autor
- PG and Research Department of Physics, AVVM Sri Pushpam College, Poondi – 613 503, Tamilnadu, India, arbalu757@gmail.com
Bibliografia
- [1] KAR S., CHAUDHURI S., Synth. React. Inorg. M., 36 (2006), 289.
- [2] AFIFY H.H., BATTISHA I.K., J. Mater. Sci.-Mater. El., 11 (2000), 373.
- [3] UDA H., SONOMURA H., IKEGAMI S., Meas. Sci. Technol., 8 (1997), 86.
- [4] LIU Y.K., ZAPIEN J.A., GENG C.Y., SHAN Y.Y., LEE C.S., LIFSHITZ Y., LEE S.T., Appl. Phys. Lett., 85 (2004), 3241.
- [5] DUAN X., HUANG F.Y., AGARWAL R., LIEBER C.M., Nature, 421 (2003), 241.
- [6] ACOSTA D., MAGANA C., MARTINEZ A., MALDONADO A., Sol. Energ. Mat. Sol. C., 82 (2004), 11.
- [7] PATIL B., NAIK D., SHRIVASTAVE V., Chalcogenide Lett., 8 (2011), 117.
- [8] KHALLAF H., CHAI G., LUPAN O., CHOW L., PARK S., SCHULTE A., Appl. Surf. Sci., 255 (2009), 4129.
- [9] LEE J., YI J., YANG K., PARK J., OH R., Thin Solid Films, 431 (2003), 344.
- [10] BACAKSIZ E., TOMAKIN M., ALTULBAS M., PARLAK M., COLAGOKLU T., J. Phys.-Condens. Mat., 403 (2008), 3740.
- [11] CHANDRAMOHAN S., STRACHE T., SARANGI S., SATHYAMOORTHY R., SOM T., Mater. Sci. Eng. BAdv., 171 (2010), 16.
- [12] SATHYAMOORTHY R., SUDHAGAR P., BALERNA A., BALASUBRAMANIAN C., BELLUCCI S., POPOV A.I., ASHOKAN K., J. Alloy. Compnd., 493 (2010), 240.
- [13] SAHAY P.P., NATH R.K., TEWARI S., Cryst. Res. Technol., 42 (2007), 275.
- [14] ASHOUR A., Turk. J. Phys., 17 (2003), 551.
- [15] TOMITA Y., KAWAI T., HATANAKA Y., Jpn. J. Appl. Phys., 33 (1994), 3383.
- [16] ULLRICH B., SAKI H., SEGAWA Y., Thin Solid Films, 385 (2001), 220.
- [17] BOIERIU P., SPORKEN R., XIN Y., BROWNING N., SIVANANTHAN S., J. Electron. Mater., 29 (2000), 718.
- [18] PRADHAN B., SHARMA A.K., RAY A.K., J. Cryst. Growth, 304 (2007), 388.
- [19] ILIEVA M., DIMOVA-MALINOVSKA D., RANGUELOV B., MARKOV I., J. Phys. Condens. Mater., 11 (1999), 10025.
- [20] ATAY F., BILGIN V., AKYUZ I., KOSE S., Mater. Sci. Semicond. Process., 6 (2003), 197.
- [21] ANBARASI M., NAGARETHINAM V.S., BALU A.R., Int. J. Chem. Phys. Sci., 3 (2014), 1.
- [22] SIVARAMAN T., NAGARETHINAM V.S., BALU A.R., J. Mater. Sci. Res., 2 (2014), 6.
- [23] WILSON K.C., MANIKANDAN E., BASHEE AHAMED M., MWAKIKUNGA B.W., J. Alloy. Compd., 585 (2014), 555.
- [24] BALU A.R., NAGARETHINAM V.S., SUGANYA M., ARUNKUMAR N., SELVAN G., J. Electr. Dev., 12 (2012), 739.
- [25] DZHAFAROV T.D., ONGUL F., AYDIN YUKSEL S., Vacuum, 84 (2010), 310.
- [26] NARASIMMAN V., NAGARETHINAM V.S., BALU A.R., SUGANYA M., ANBARASI M., USHARANI K., Int. J. Appl. Res. Eng. Sci., 1 (2014), 7.
- [27] CHU J., JIN Z., CAI S., YANG J., HONG Z., Thin Solid Films, 520 (2012), 1826.
- [28] USHARANI K., BALU A.R., SHANMUGAVEL G., SUGANYA M., NAGARETHINAM V.S., Int. J. Sci. Res. Rev., 2 (2013), 53.
- [29] RAJASHREE C., BALU A.R., NAGARETHINAM V.S., Int. J. ChemTech Res., 6 (2014), 347.
- [30] SHAH N.A., SAGAR R.R., MAHMOOD W., SYED W.A.A., J. Alloy. Compd., 512 (2012), 185.
- [31] WANG Y.G., LAU S.P., LEE H.W., LU S.F., TAY S.K., ZANG X.Z., HING H.H., J. Appl. Phys., 94 (2003), 354.
- [32] VINODKUMAR R., LETHY K.J., ARUNKUMAR P.R., RENJU KRISHNAN R., VENUGOPALAN PILLAI N., MAHADEVAN PILLAI V.P., PHILIP R., Mater. Chem. Phys., 121 (2010), 406.
- [33] KOSE S., ATAY F., BILGIN V., AKYUZ I., KETENCI E., Appl. Surf. Sci., 256 (2010), 4299
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-4a4f122d-faa1-443f-90e6-c774635b4831