X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co2FeAl) interfaced with semiconductor (n-Si) structure

• Autorzy: Kumar, Arvind , Srivastava, P. C.
• Języki publikacji: EN

Abstrakty

EN

Layered magnetic heterostructures are very promising candidates in spintronics in which the influences of interfaces, surfaces and defects play a crucial role. X-ray photoelectron spectroscopy (XPS) study has been performed for studying in detail the chemical state and electronic structure of Co₂FeAl (CFA) Heusler alloy interfaced with Si substrates. XPS survey scan spectra have clearly shown the presence of Fe, Co and Al signal along with the signal due to Si. The presence of Co, Fe and Al signal confirms the formation of CFA alloy phase. Our XPS results support our previous study [1] on CFA/Si structure in determining the magnetic and transport properties across the interface.

Słowa kluczowe

EN

Co2FeAl; Heusler alloy; XPS; XRD; silicides

• Czasopismo: Materials Science Poland
• Rocznik: 2019
• Tom: Vol. 37, No. 1
• Strony: 116--121
• Opis fizyczny: Bibliogr. 22 poz., rys.

Twórcy

autor

Kumar, Arvind

• Department of Physics, Atma Ram Sanatan Dharma College, University of Delhi, Dhaula Kuan, New Delhi-110021, India,
• Department of Physics, Banaras Hindu University, Varanasi-221005, India

autor

Srivastava, P. C.

• Department of Physics, Banaras Hindu University, Varanasi-221005, India

Bibliografia

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Uwagi

PL

Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).

Identyfikatory

DOI

10.2478/msp-2019-0001