Self-noise reduction in a FOG-based rotational seismometer confirmed by Allan variance analysis

• Autorzy: Zając, Piotr , Amrozik, Piotr , Kiełbik, Rafał , Maj, Cezary , Szermer, Michał , Starzak, Łukasz , Pękosławski, Bartosz , Jabłoński, Grzegorz , Tylman, Wojciech , Kurzych, Anna , Jaroszewicz, Leszek R.
• Języki publikacji: EN

Abstrakty

EN

Reducing noise in fibre-optic gyroscope (FOG)-based rotational seismometers is crucial in guaranteeing their applicability as future high-precision sensors. This paper presents a practical approach to noise analysis of a designed and manufactured FOG-based three-axis rotational seismometer. The performed measurements show that proper identification of noise sources and subsequent changes to the device’s configuration which addressed these noise issues, visibly improved the Allan deviation plot of the device. In particular, angle random walk was reduced from 100–200 to around 35 nrad/s/√Hz and bias instability – from several dozens down to single nrad/s. These improvements were achieved only by elimination or mitigation of the impact of all noise sources, without changing any optoelectronic components of the constructed device and without applying any additional post-processing methods.

Słowa kluczowe

EN

fibre-optic rotational seismometer; fibre-optic gyroscope; Allan variance; noise; angle random walk; bias instability

• Czasopismo: Opto-Electronics Review
• Rocznik: 2024
• Tom: Vol. 32, No. 4
• Strony: art. no. e152766
• Opis fizyczny: Bibliogr. 43 poz., rys., fot., wykr., tab.

Twórcy

autor

Zając, Piotr

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland,

autor

Amrozik, Piotr

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Kiełbik, Rafał

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Maj, Cezary

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Szermer, Michał

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Starzak, Łukasz

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Pękosławski, Bartosz

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Jabłoński, Grzegorz

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Tylman, Wojciech

• Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland

autor

Kurzych, Anna

• Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland
• Elproma Elektronika Sp. z o.o., ul. Dunska 2A, 05-152 Czosnow, Poland

autor

Jaroszewicz, Leszek R.

• Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland
• Elproma Elektronika Sp. z o.o., ul. Dunska 2A, 05-152 Czosnow, Poland

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Uwagi

This work was supported by the Polish Agency for Enterprise
Development project FENG.01.01-IP.02-1714/23 and
the National Centre for Research and Development project
POIR.01.01.01-00-1553/20-00.

Identyfikatory

DOI

10.24425/opelre.2024.152766