Enhancement of XPS surface sensitivity in nanocrystalline material

• Autorzy: Rafal Wróbel
• Języki publikacji: EN

Abstrakty

EN

The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.

Słowa kluczowe

EN

XPS; nanomaterials; surface science

• Czasopismo: Polish Journal of Chemical Technology
• Rocznik: 2010
• Tom: 12
• Numer: 4
• Strony: 62-63

Daty

wydano

2010-01-01

online

2010-12-28

Twórcy

autor

Rafal Wróbel

• Institute of Chemical and Environment Engineering, West Pomeranian University of Technology, ul. Pulaskiego 10, 70-322 Szczecin, Poland

Bibliografia

• Tougaard, S. (2005). XPS for Quantitative Analysis of Surface Nano-structures. Microsc. Microanal. 11(2), 676-677. DOI:10.1017/S1431927605500229.[PubMed][Crossref]
• Jablonski, A. & Powell, C. J. (2004). Electron effective attenuation lengths in electron spectroscopies, J. Alloy. Compd. 362, 26-32. DOI:10.1016/S0925-8388(03)00558-9.[Crossref]
• Gunter, P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19, 161-164. DOI: 10.1002/sia.740190131.[Crossref]
• Suchorski, Y., Wrobel, R., Becker, S., Opalinska, A., Narkiewicz, U., Podsiadly, M. & Weiss, H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study, Acta Phys Pol A, 114, 125 0150 134.
• Briggs, D. (2005). Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, Cambridge University Press.

Identyfikatory

DOI

10.2478/v10026-010-0052-8