Czasopismo
Tytuł artykułu
Autorzy
Warianty tytułu
Języki publikacji
Abstrakty
The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Numer
Strony
62-63
Opis fizyczny
Daty
wydano
2010-01-01
online
2010-12-28
Twórcy
autor
- Institute of Chemical and Environment Engineering, West Pomeranian University of Technology, ul. Pulaskiego 10, 70-322 Szczecin, Poland
Bibliografia
- Tougaard, S. (2005). XPS for Quantitative Analysis of Surface Nano-structures. Microsc. Microanal. 11(2), 676-677. DOI:10.1017/S1431927605500229.[PubMed][Crossref]
- Jablonski, A. & Powell, C. J. (2004). Electron effective attenuation lengths in electron spectroscopies, J. Alloy. Compd. 362, 26-32. DOI:10.1016/S0925-8388(03)00558-9.[Crossref]
- Gunter, P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19, 161-164. DOI: 10.1002/sia.740190131.[Crossref]
- Suchorski, Y., Wrobel, R., Becker, S., Opalinska, A., Narkiewicz, U., Podsiadly, M. & Weiss, H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study, Acta Phys Pol A, 114, 125 0150 134.
- Briggs, D. (2005). Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, Cambridge University Press.
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_v10026-010-0052-8