Secondary electron microscopy and transmission electron microscopy studies of carbon nanotubes in C-Ni films

• Autorzy: Mirosław Kozłowski , Piotr Dłużewski , Ewa Kowalska , Elżbieta Czerwosz
• Języki publikacji: EN

Abstrakty

EN

Carbon nanotubes films have been studied with SEM and TEM. The studied films were obtained using a two step method: PVD process and CVD process. Strongly defected and curled carbon nanotubes containing Ni nanoparticles formed the film with thickness of about 300–400 nm. Observed carbon nanotubes were of lengths from 100 nm to 300 nm and did not stick to each other.

Słowa kluczowe

EN

MWCNT; PVD; CVD; nickel nanoparticles

• Czasopismo: Open Physics
• Rocznik: 2011
• Tom: 9
• Numer: 2
• Strony: 344-348

Daty

wydano

2011-04-01

online

2011-02-20

Twórcy

autor

Mirosław Kozłowski

• Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland,

autor

Piotr Dłużewski

• Institute of Physics PAS, Al. Lotników 32/46, 02-668, Warszawa, Poland

autor

Ewa Kowalska

• Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland

autor

Elżbieta Czerwosz

• Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland

Bibliografia

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Identyfikatory

DOI

10.2478/s11534-010-0106-9