Comparison characterization of copper selenide thin layers prepared on polyamide 6 films by sorption-diffusion method

• Autorzy: Remigijus Ivanauskas , Vitalijus Janickis , Vitalija Jasulaitienė
• Języki publikacji: EN

Abstrakty

EN

Some earlier synthesized copper selenide (Cux Se) layers formed on the surface of polyamide 6 by sorption-diffusion method using potassium selenotrithionate (K2SeS2O6) as precursor of selenium were characterized by the XRD, XPS and SEM methods. According to the results of the SEM studies, the most uniform Cux Se layers form at the 2.5 h polyamide seleniumized duration at the temperature of 60°C. The thickness of layers, which dependeds on the duration of seleniumization, changed in the range of 0.8–3.2 µm. The XRD patterns of not previously studied Cux Se layers showed their phase composition of six copper selenides: Cu2Se, two phases of CuSe2, Cu3Se2, berzellianite, Cu2-x Se, and bellidoite Cu2Se. Analysis of the XRD and XPS data shows that the macrostructure and composition of the CuxSe layers depend on the conditions of formation of these layers. [...]

Słowa kluczowe

EN

Polyamide; Copper selenide layers; XRD; XPS; SEM

• Czasopismo: Open Chemistry
• Rocznik: 2013
• Tom: 11
• Numer: 4
• Strony: 636-643

Daty

wydano

2013-04-01

online

2013-01-23

Twórcy

autor

Remigijus Ivanauskas

• Department of Inorganic Chemistry, Faculty of Chemical Technology, Kaunas University of Technology, LT-50254, Kaunas, Lithuania,

autor

Vitalijus Janickis

• Department of Inorganic Chemistry, Faculty of Chemical Technology, Kaunas University of Technology, LT-50254, Kaunas, Lithuania

autor

Vitalija Jasulaitienė

• Institute of Chemistry, Center for Sciences and Technology, LT-01108, Vilnius, Lithuania

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Identyfikatory

DOI

10.2478/s11532-012-0200-5