The influence of process conditions on the formation of thallium sulfide layers on polyethylene by the use of higher polythionic acid H2S33O6

• Autorzy: Ingrida Bružaitė , Vitalijus Janickis
• Języki publikacji: EN

Abstrakty

EN

Thallium sulfide layers of varying composition form on the surface of low-density polyethylene (PE) when the PE films have been sulfurized in a solution of higher polythionic acid H2S33O6, and then immersed in the alkaline solution of thallium (I) sulfate. The concentration of sulfur sorbed-diffused into PE surface increases with the increase of the sulfurization time and concentration of higher polythionic acid solution. The concentration of thallium in the Tlx Sy layers depends on the sulfur concentration sorbed-diffused into PE, the concentration, and temperature of thallium (I) sulfate solutions. By chemical analysis of the obtained sulfide layers it was determined that the values of x and y in the TlxSy layers varies in the intervals: 1xy2S2 were identified by X-ray diffraction analysis in thallium sulfide layers. Scanning Electron (SEM) and Atomic Force (AFM) microscopies were used to characterize surface morphology of thallium sulfide layers. The films deposited on the PE surface have a non-homogeneous structure, and consist of separated islands. [...]

Słowa kluczowe

EN

Thallium sulfide layers; Modification of Polyethylene

• Czasopismo: Open Chemistry
• Rocznik: 2013
• Tom: 11
• Numer: 4
• Strony: 629-635

Daty

wydano

2013-04-01

online

2013-01-23

Twórcy

autor

Ingrida Bružaitė

• Department of Chemistry and Bioengineering, Vilnius Gediminas Technical University, LT-10223, Vilnius, Lithunania,

autor

Vitalijus Janickis

• Department of Inorganic Chemistry, Kaunas University of Technology, LT- 50254, Kaunas, Lithuania

Bibliografia

• [1] N.M. Megahid, Chinese J. Phys. 41, 130 (2003)
• [2] A.M. Badr, H.A. Elshaikh, I.M. Ashraf, Pramana J. Phys. 72, 871 (2009) http://dx.doi.org/10.1007/s12043-009-0078-8[Crossref]
• [3] I.M. Ashraf, H.A. Elshaikh, A.M. Badr, Phys. Status Solidi B 241, 885 (2004) http://dx.doi.org/10.1002/pssb.200301938[Crossref]
• [4] V. Estrella, R. Mejia, M.T.S. Nair, P.K. Nair, Modern Physics Letters B 15, 737 (2001) http://dx.doi.org/10.1142/S0217984901002427[Crossref]
• [5] Y. Ni et al., Solid State Communications 130, 297 (2004) http://dx.doi.org/10.1016/j.ssc.2004.02.022[Crossref]
• [6] H. A. Elshaikh, I.M. Ashraf, A.M. Badr, J. Phys. Chem. B 108, 11327 (2004) http://dx.doi.org/10.1021/jp031035z[Crossref]
• [7] A. Mondal, P. Pramanik, Thin Solid Films 110, 65 (1983) http://dx.doi.org/10.1016/0040-6090(83)90174-8[Crossref]
• [8] V. Janickis, I. Ancutienė, I. Bružaitė, Chemical Technology 2, 35 (2002) (in Lithuanian)
• [9] R. Ivanauskas, V. Janickis, I. Ancutienė, R. Stokienė, Cent. Eur. J. Chem. 7, 864 (2009) http://dx.doi.org/10.2478/s11532-009-0088-x[Crossref]
• [10] I. Bružaitė, Formation and study of thallium sulfide layers on the surface of the polyethylene, PhD thesis, (Kaunas University of Technology, Lithuania, 2005) (in Lithuanian)
• [11] J. Janickis et al., Trans. Lithuanian Acad. Sci. Ser. B 88, 83 (1975) (in Lithuanian)
• [12] A. Babko, A. Pilipenko, Photometric Analysis. Method for determination of non-metals (Khimiya, Moscow, 1979) (in Russian)
• [13] Analytical methods for atomic absorption spectrometry, Perkin-Elmer 503 (1973)
• [14] J. Tudo, B.C.R. Jolibois, Seances Acad. Sci. Ser. C 80, 1375 (1975)
• [15] K. Nakamura, S. Kashiba, J. Phys. Soc. Jpn. 62, 135 (1993)
• [16] S. Kashiba, K. Nakamura, Solid State Chem. 110, 64 (1994)
• [17] A. Radtke, F.M. Dickson, J. American Mineralogist 0, 559 (1975)
• [18] I. Ancutienė, V. Janickis, S. Grevys, A. Žebrauskas, Chemistry 4, 3 (1996) (in Lithuanian)

Identyfikatory

DOI

10.2478/s11532-012-0198-8