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Tytuł artykułu
Warianty tytułu
Języki publikacji
Abstrakty
The purpose of this work was to deposit Zn-containing films on Si substrates using the commercial atmospheric pressure plasma jet “kINPen’09.” In preliminary experiments Zn-containing films were deposited on the silicon substrates immersed in water solutions of Zn(NO3)2•6H2O salt. The surface composition of deposited films was analyzed by the XPS (X-ray photoelectron spectroscopy) technique while the bulk composition was studied by means of XRD (X-ray diffraction) mesurements. The film thickness was measured by a profilometer. We have determined that the concentration of the zinc nitrate solution as well as changes in the deposition time resulted in a large fluctuation of the deposited film thickness. However, the successful deposition of the Zn-containing films on the Si substrate was definitely confirmed.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Numer
Opis fizyczny
Daty
otrzymano
2014-01-30
zaakceptowano
2014-05-14
online
2014-11-17
Twórcy
autor
- Dept. of Physical Electronics, Masaryk University, 61137 Brno, Czech Republic, oleksandr.galmiz@gmail.com
autor
- Dept. of Physical Electronics, Masaryk University, 61137 Brno, Czech Republic
autor
- University of Greifswald, Institute of Physics, 17489 Greifswald, Germany
autor
- Institute of Experimental and Applied Physics, Christian-Albrechts-Universitat zu Kiel, 24098 Kiel, Germany
autor
- Dept. of Physical Electronics, Masaryk University, 61137 Brno, Czech Republic
autor
- Dept. of Physical Electronics, Masaryk University, 61137 Brno, Czech Republic
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_1515_chem-2015-0020