In the present study, the lead-free BaTi1-x Zrx O3 (for x = 0, 0.05 and 0.15) ceramics were prepared by High-Energy Ball Milling and heat treatments. The performed X-ray, SEM and EDS measurements confirmed high purity, good quality and the expected quantitative composition of the obtained samples. The study of dielectric properties was performed by means of broadband dielectric spectroscopy at the frequency ranging from 0.1 Hz to 10 MHz. The obtained measurement data, analyzed in accordance with the Arrhenius formalism demonstrated the presence of relaxation type dielectric mechanisms. The impedance answer of studied ceramic materials indicated the presence of two relaxation processes: one with a dominant resistive component and the other with a small capacitive component. The observed dielectric relaxation process is temperature dependent and has a “non-Debye” character.