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Microstructure- transport property relation in yttria-doped zirconia

Rizea A., Chirlesan G., Kusinski J., Petot-Ervas G., Petot C.

Inżynieria Materiałowa

2004

R. XXV, nr 3

430-433

Transmission electron microscopy, XPS analysis, electrical conductivity and diffusion measurements have allowed us to show the microstructure-transport property relation in ZrO2- 9.0mol% Y2O3 (YSZ) and Al2O3-YSZ composites. Samples with no detectable amorphous grain boundary precipitates show the highest grain boundary electrical conductivity (...gb) and oxygen diffusion coefficient (Do) values, which decrease in presence of alumina additions. On the contrary, alumina additions = or<2 mol%) lead to an increase of the transport properties of samples showing grain boundary glassy films. These results were attributed to a decrease of the grain boundary wettability by the glassy phase when the alumina amount increases. Furthermore, the same grain boundary activation energy found for the different samples show that only "clean" grain boundaries contribute to the transport processes.