Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników

Znaleziono wyników: 2

Liczba wyników na stronie
first rewind previous Strona / 1 next fast forward last
Wyniki wyszukiwania
help Sortuj według:

help Ogranicz wyniki do:
first rewind previous Strona / 1 next fast forward last
EN
Results are presented of XPS characterization of ultra-thin copper phthalocyanine (CuPc) (16 nm- QCM controlled) films thermally deposited under UHV conditions on p- and n- type Si(111) substrates covered by native oxide. Our attempt has been focused on comparative studies of thin films in terms of the stability and durability of CuPc layers after one year of aging in ambient atmosphere. The impact of the type of the substrate doping was also explored. Our results clearly prove that CuPc layers are chemically stable and durable after one year exposure to air. We also demonstrate the existence of the substrate doping impact on the CuPc ultra-thin film what might be caused by dipole effects.
EN
We review a variety of experiments made in Ultra High Vacuum by means of X-ray and Ultraviolet Photoelectron Spectroscopy on some representative Phthalocyanine/Silicon (PC/Si) interfaces: NiPC/Si(111)7x7, PbPC/Si(100)2x1, PbPC/Si(111)7x7, CuFPC/Si(100)2x1, CuFPC/Si(111)7x7. As a first evidence, we demonstrate the adsorption without dissociation of the molecules. At the stage of deposition of few (nominally one or two ) monolayers, the experimental evidences always suggest the planar adsorption of those molecules onto the two most common reconstructions of Si(111) and Si(100). Anyway there can be evidenced interesting and enlightening spectral differences, with varying the central metal atom (lead inplace of a transition metals like Ni or Cu), the silicon substrate, or the expected strength or ad-molecule to substrate chemisorption (by substituting H with F at the four outer benzenic ring of the molecule). The importance of such studies for a more fundamental understanding of the interaction of PCs with reactive substrates is addressed in view of the fabrication of PC based gas sensors.
first rewind previous Strona / 1 next fast forward last
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.