We have worked out an innovative system for the identification of superficial defects in low critical metallic patches. In a few seconds we reconstruct, using the fundamental principles of shape from shading, the third dimension of a digitized image, thanks to which we can identify the presence of a defect. Testing shows that the results achieved are more than satisfactory also in relation to the good rejection of the noises from the algorithm. Moreover we propose the advantages of using this system in an industrial field, and the conditions to be verified in industry in order to be able to test this technique.
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.