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The performed measurements show that proper identification of noise sources and subsequent changes to the device’s configuration which addressed these noise issues, visibly improved the Allan deviation plot of the device. In particular, angle random walk was reduced from 100–200 to around 35 nrad/s/√Hz and bias instability - from several dozens down to single nrad/s. These improvements were achieved only by elimination or mitigation of the impact of all noise sources, without changing any optoelectronic components of the constructed device and without applying any additional post-processing methods.
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