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Content available remote Investigation of aerosol droplets diameter generated in aerosol jet printing
EN
Aerosol jet printing is a contactless direct-write technique that could be used for the deposition of a variety of materials. First, used for electric paths, the technology was explored for many applications. The substantial part of the process is the generation of aerosols. The size of the droplets and the stability of the process affect the quality of the sprayed lines. This article investigates the diameter of the sprayed droplets, allowing future comparison of the results with sprayed lines. Droplets from ultrasonic and pneumatic generators were sprayed at their outlet on the polyethylene terephthalate (PET) foil. Using a digital microscope and the built-in algorithm, the diameter of the droplets was measured, and the dataset was collected as CSV files and served as a background to the box plot. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) scans were applied to verify the results obtained. The ink parameters used in the process have an influence on the aerosol generation and droplet diameter, whereas the carrier gas pressure has an impact mostly on the droplet diameter. In this case, the aerosol was produced from three types of ink in combination with two generators. For inks with a dynamic viscosity below 6.5 m·Pa-1·s-1a stable range of 5–10 μm droplet diameter was observed. A high-viscosity ink (7.5–10.5 m·Pa-1·s-1) produced droplets with diameter in the range of 6–25 μm. The diameter of the droplet decreased from 7–22 μm to 1–5 μm with a reduction in the dynamic viscosity from 7.5–10.5 m·Pa-1·s-1 to 4.5–5.5 m·Pa-1·s-1.
EN
Scanning electron microscopy (SEM) is a perfect technique for micro-/nano-object imaging [1] and movement measurement [2, 3] both in high and environmental vacuum conditions and at various temperatures ranging from elevated to low temperatures. In our view, the magnetic field expanding from the pole-piece makes it possible to characterize the behaviour of electromagnetic micro- and nano-electromechanical systems (MEMS/NEMS) in which the deflection of the movable part is controlled by the electromagnetic force. What must be determined, however, is the magnetic field expanding from the e-beam column, which is a function of many factors, like working distance (WD), magnification and position of the device in relation to the e-beam column. There are only a few experimental methods for determination of the magnetic field in a scanning electron microscope. In this paper we present a method of the magnetic field determination under the scanning electron column by application of a silicon cantilever magnetometer. The micro-cantilever magnetometer is a silicon micro-fabricated MEMS electromagnetic device integrating a current loop of lithographically defined dimensions. Its stiffness can be calibrated with a precision of 5% by the method described by Majstrzyk et al. [4]. The deflection of the magnetometer cantilever is measured with a scanning electron microscope and thus, through knowing the bias current, it is possible to determine the magnetic field generated by the e-beam column in a defined position and at a defined magnification.
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