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1

Automated substrate resistance extraction in nanoscale VLSI by exploiting a geometry-based analytical model

Bontzios Y. I., Dimopoulos M. G., Hatzopoulos A. A.

International Journal of Microelectronics and Computer Science

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2011

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Vol. 2, nr 3

81-87

EN

In this work, a new automated method for determining the substrate resistance is presented. It exploits a geometric formulation of the current streamlines between coupled structures and builds an analytical model for the substrate resistance. Both simulation and measurement data are utilized in order to show the validity of the proposed scheme. The measurement data are obtained from a fabricated test chip. The results show that the proposed method succeeds in computing the substrate resistance while the average error falls within 5%.

2

Wavelet energy-based mahalanobis distance metric for testing analog and mixed-signal circuits

Spyronasios A. D., Dimopoulos M. G., Hatzopoulos A. A.

International Journal of Microelectronics and Computer Science

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2010

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Vol. 1, nr 2

218-224

EN

In this paper a test method based on the wavelet transformation of the measured signal, be it supply current (Ips) or output voltage (Vout) waveform, is presented. In the wavelet analysis, a Mahalanobis distance test metric is introduced utilizing information from the wavelet energies of the first decomposition level of the measured signal. The tolerance limit for the good circuit is set by statistical processing data obtained from the fault-free circuit. Simulation comparative results on benchmark circuits for testing both hard faults and parametric faults are presented showing the effectiveness of the proposed testing scheme.

3

Testing of an optical feedback pixel driver using supply current

Papadopoulos N. P., Hatzopoulos A. A., Papakostas D. K.

Elektronika : konstrukcje, technologie, zastosowania

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2009

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Vol. 50, nr 12

79-82

EN

The testing of an optical feedback pixel driver is discussed and simulated by HSPICE. A basic characteristic of the specific circuit is the fact that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output / pixel current (which is proportional to / oled) has to be measured or calculated and tested. The method that is presented enables the detection and identification of many common processing defects up to 88%.

PL

Artykuł ten omawia problem testowania drajwerów pikseli ze sprzężeniem optycznym na przykładzie symulacji przeprowadzonych przy użyciu program HSPICE. Podstawową cechą omawianego układu jest to, że skala szarości pikseli tworzona jest poprzez modulację szerokości impulsów (PWM). Zatem wielkością jaką należy zmierzyć lub obliczyć jest całka prądu wyjściowego / pixel (proporcjonalnego do /oled). Zaprezentowana metoda pozwala na wykrycie i identyfikację do 88% najczęściej występujących wad technologicznych.