A new version of the JM-SPC computer program written by J. Mutwil in Delphi for statistical control of production processes is presented. All changes have been by users suggestions caused. For the attribute valued data type most of new features have been joined to data introducing option. In this way the program allows to consider a wider data spectrum. Usefulness of the introduced solutions for statistical analysis of the attribute valued data type gained from real processes has been presented on the example of Al-Si high-pressure die casting production. The analysis refers to a serial produced casting and includes: 1) the analysis of defect fraction in sample (by using the p-chart), 2) the analysis of relative differences in importance of each defects categories (by using of the Pareto diagram).
2
Dostęp do pełnego tekstu na zewnętrznej witrynie WWW
Usefulness of the JM-SPC computer program for a statistical analysis of variable valued data proceeded from an Al-Si high-pressure die casting production processes was examined. An analysis subject were results of dimensional measurement of 16 casting dimensions systematically controlled on coordinate-measuring machine. For analysis two criterion have been used: 1) X-s control chart and the performance indicator of processes by using of two commonly used indices: potential process capability index (Cp) and process capability index (Cpk).
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.