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1
Content available Optical and Structural Properties of Cu2O thin Film as Active Layer in Solar Cells Prepared by DC Reactive Magnetron Sputtering
Sawicka-Chudy P., Wisz G., Sibiński M., Cholewa M., Potera P., Głowa Ł., Pawełek R.
Archives of Metallurgy and Materials
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2019
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Vol. 64, iss. 1
243--250
EN
A series of copper oxide thin films were synthesized through direct current magnetron sputtering on glass and silicon substrates with various process parameters. Initially, optical microscopy images and their histograms were analyzed to determine the optical quality of the obtained layers and then histograms were created using Image Histogram Generator software. Next, the morphology, and cross-section and layer composition of the samples were evaluated. Finally, the transmission spectra of the thin films were recorded. Transmittance and reflection spectra of the UV–vis analysis were utilized to calculate the optical band gap, the extinction coefficient, and the absorption coefficient of the oxidized layers. Samples showed low transmittance (up to 40%) in the region of 400 to 1000 nm. The mean absorption coefficient varied from ~3 · 105 to ~6 · 105 1/cm and from ~2 · 105 to ~4 · 105 1/cm in the region of 2 eV to 3.5 eV. The extinction coefficient ranged from 0 to 0.11 in the region from 300 to 3000 nm. Reflectance of the samples was ~20% in the region of 1000 to 2500 nm and ranged from 20%-50% in the region of 1000 to 3000 nm. We verified the process parameters of the Cu2O structure to improve the quality as a buffer layer. On the basis of this preliminary analysis, we propose the most promising and future-oriented solutions in photovoltaic applications.
2
Content available remote Symulacja numeryczna ogniw heterozłączowych TiO2/Cu2O(CuO), przy pomocy programu SCAPS
Sawicka-Chudy P., Sibiński M., Cholewa M., Sosna-Głębska A., Wisz G.
Przegląd Elektrotechniczny
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2018
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R. 94, nr 8
17--20
PL
W artykule przedstawiono wyniki symulacji numerycznej modeli cienkowarstwowych struktur fotowoltaicznych w programie SCAPS. Obliczono podstawowe parametry elektryczne (Jsc, η, VMPP, JMPP) dla standardowych warunków testowych STC (AM1.5G, 100 mW/cm2, 300K) oraz zbadano wpływ warstwy absorbera (Cu2O, CuO) i warstwy buforowej (TiO2) na działanie ogniw słonecznych. Następnie porównano charakterystyki pojemnościowo-napięciowe, Mott Schottky’iego oraz wpływ defektów dla ogniw TiO2/Cu2O oraz TiO2/CuO.
EN
In the presented work, the Cu2O/TiO2 and CuO/TiO2 heterojunction solar cells have been analyzed by the help of Solar Cell Capacitance Simulator (SCAPS). The effect of absorber and buffer layers on the cell photoconversion efficiency, short circuit current density and open circuit voltage were simulated without defects. Next, capacitance-voltage, Mott–Schottky characteristic were calculated and analized. Finally, authors examined the effects of defect density on the efficiency.
3
Content available remote Optical properties of AlN layers obtained by magnetron sputtering
Potera P., Wisz G., Szyller Ł.
Materials Science Poland
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2018
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Vol. 36, No. 4
717--721
EN
The growth of AlN layers on glass substrates using magnetron sputtering method was performed and the grown layers were subjected to optical measurements. Transmission spectra of the layers grown at different content of N2 in the atmosphere were obtained. The transmission spectra as well as energy gap depended on N2 content. The annealing of the layers in air led to transmission changes and influenced energy gap and refractive index values.
4
Content available Evaluation of the quality of titanium oxide and copper oxide layers by means of optical microscopy
Głuszek A., Sawicka-Chudy P., Wisz G., Sibiński M., Cholewa M.
Energy Policy Studies
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2018
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No. 1 (2)
39--51
EN
The aim of this paper is to analyse high-resolution optical images of the surface layers of titanium oxide and copper oxide. The materials were produced using the PREVAC Modular Platform for layer deposition located at the University of Rzeszów. Images with a magnification of 50x were obtained using an optical microscope. On the basis of the results obtained, the quality of the layers was evaluated based on the image analysis. The quantitative method of analysis was applied, as a result of which the conditions of the manufacturing process for which the obtained layers had the highest homogeneity were indicated. The minimum range of grey shade counting was from 65 to 150 and the maximum range from 135 to 220. The standard deviation was from 8 to 40%.
5
Content available Analysis of chemical and phase composition of copper oxide prepared by direct current sputtering for photovoltaic applications
Sawicka-Chudy P., Wielgosz M., Wal A., Cieniek B., Wisz G., Głowa Ł., Cholewa M., Sawicka J.
Energy Policy Studies
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2018
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No. 1 (2)
3--11
EN
This paper presents the application of X-ray fluorescence and X-ray diffraction methods for the study of copper oxide structures as an absorber layer in thin-film solar cells. The layers of copper oxide were applied by direct current magnetron sputtering. Quantitative and qualitative analysis of oxide layers were performed using XRF (X-ray fluorescence). The studies showed a high copper content in both samples, amounting to 98% and 96%, as well as trace amounts of other elements (nickel, lead). The XRD (X-ray diffraction) study showed Cu20 and Cu8O phases, amorphism ranging from 24% to 44%, and crystallinity from 55% to 75%. Crystallites of 30 nm were also determined. The aim of the study was to determine the chemical and phase composition of the layers obtained and to determine the degree of their contamination depending on the parameters of the manufacturing technology in terms of their application in photovoltaics. One of the samples showed an advantage both in terms of material and structural composition.
6
Content available remote Optical properties of ZnCoO layers obtained by PLD method
Potera P., Virt I., Wisz G., Cebulski J.
Materials Science Poland
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2017
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Vol. 35, No. 4
878--884
EN
Optical properties of the zinc-cobalt oxide (ZnCoO) layers manufactured at different process conditions have been investigated. ZnCoO layers were grown on sapphire and glass substrates by pulsed laser deposition (PLD) technique. The influence of growth conditions as well as post-growth annealing on the films transmission and gap energy was analyzed.
7
Content available Ablacja polikryształów CR2TE3 z wykorzystaniem lasera ND3+:YAG
Wisz G., Barwiński M., Sagan P., Kuźma M.
Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska
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2014
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nr 3
27--30
PL
W pracy badano proces laserowej ablacji Cr2Te3: dla potrzeb nanoszenia cienkich warstw tego materiału metodą impulsowego osadzania laserowego (PLD). Target przygotowano w formie sprasowanej pastylki z proszkowego Cr2Te3 domieszkowanego proszkowym Zn. Do odparowania tarczy zastosowano promieniowanie lasera ND3+:YAG o długości impulsu 20 ns i gęstości energii 16 J/cm2 oraz 34 J/cm2. Metodą EDX zbadano skład powierzchni targetu po ablacji. Stwierdzono nadmiar chromu co wskazuje na jego słabą desorpcję przy zastosowanych parametrach ablacji.
EN
In the paper, the process of laser ablation of Cr2Te3 has been studied in the respect of its application to thin solid films deposition of this material in the pulsed laser deposition (PLD) technology. Target has been prepared in the shape of pressed tablet from powder Cr2Te3. The energy density of the ND3+:YAG laser beam were 16 J/cm2 and 34 J/cm2 and the time of laser pulse was 20 ns. The composition of the surface layer of the target after ablation has been measured using EDX method. The excess of chromium in respect to it amount in initial composition has been measured. This result points on the weak desorption of this component at the ablation parameters applied.
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