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EN
The paper presents the results of research on the surface topography and electrical properties of ITO thin films deposited by PVD for applications in silicon photovoltaic cells. The surface condition and chemical composition were characterized using a scanning electron microscope and the thickness and optical constants were measured using a spectroscopic ellipsometer. To compare the impact of the preparation process on the properties of layers, deposition was carried out at three different temperatures: 25, 200, and 400◦C. As the temperature increased, the surface roughness changed, which correlated with the results of structural tests. The crystallite size increased from 11 to 46 nm. This, in turn, reduced the surface resistance. The electrical properties were measured using a four-point probe method and then the prepared solar cells containing ITO thin films in their structure were examined. By controlling the deposition parameters, the surface resistance of the deposited layer (26 Ohm/✷) and the efficiency of the prepared solar cells (18.91%) were optimized. Currently, ITO has the best properties for use in optoelectronics and photovoltaics among the known TCO layers. The magnetron sputtering method is widely used in many industries. Therefore, the authors predict that TCO layers can replace currently used antireflection layers and reduce the number and dimensions of front metal contacts in solar cells.
EN
The paper deals with analysis of recognition of surface quality with reflective structures. Such surfaces are common in metallic materials cut using a saw or polished. There are no easy methods to identify such elements after machining. This issue is crucial in the industry for quality control as recognition of the elements, for instance after failure, allows for a detailed study of their manufacturing process. Firstly, six cuboid steel elements were obtained from a larger beam with a circular saw. Then, the bidirectional reflection distribution function (BRDF) was obtained for each element 3 times. The BRDF profiles were used in custom recognition software based on the K-nearest neighbors algorithm. In total, 140 variants of the classifier were tested and analyzed. Additionally, each variant was solved 200 times with different splits of the dataset. The results showed a high multiclass accuracy in all considered variants of the algorithm, with multiple variants achieving 100% accuracy. This level of performance was attained with only 1 to 2 training samples per class. Its low numerical complexity, easy experimental procedure, and “one-shot” nature allow for fast recognition, which is crucial in industrial applications.
EN
The presented work describes the method of measuring surface topography with application of BRDF (bidirectional reflectance distribution function), ellipsometry and spectrophotometry. This non-contact method enables measurement and analysis of large area surfaces, such as plasters and facades. A standard method of topography analysis does not describe sufficiently all of the interesting features. The visual aspect of the surface evaluation is very important from the functional and utilitarian point of view. The proposed methods of surface analysis enable not only the quantitative evaluation but also indirectly the qualitative properties (visual aspects).
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