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Content available remote Four-Parameter Sine-Fitting Algorithm for Detection and Classification of Transients and Waveform Distortions
Ramos P. M., Radil T., Cruz Serra A.
Metrology and Measurement Systems
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2008
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Vol. 15, nr 4
441-456
EN
This paper describes a new method for detection of some power quality (PQ) disturbances, namely transients and waveform distortions. The proposed algorithm is based on a modified version of the four-parameter sine-fitting algorithm. The sine-fitting algorithm is used to estimate the parameters of the power system's voltage signal's fundamental and to extract the transient component of the voltage. The performance of the proposed method is compared with previously developed algorithm and with two commercial PQ analyzers.
2
Content available remote DSP based power quality analyzer for detection and classification of disturbances in a single-phase power system
Radil T., Ramos P. M., Janeiro F. M., Cruz Serra A.
Metrology and Measurement Systems
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2007
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Vol. 14, nr 4
483-494
EN
This paper describes the prototype of a power quality analyzer designed for real-time detection and classification of disturbances that occur in a single-phase power system. The standalone DSP-based analyzer implements previously developed algorithms for detection and classification of power quality disturbances such as transients, waveform distortions, sags, swells and interruptions. Its performance was verified during long term monitoring of the power system.
3
Content available remote ADC and DAC modelling and testing - state of the art
Cruz Serra A., Daponte P., Michaeli L.
Metrology and Measurement Systems
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2005
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Vol. 12, nr 3
231-248
EN
The analog to digital front ends of measuring instruments affect crucially the interpretation of the signals acquired from the real world into the digital domain and their back presentation. The signal processing in the digital domain due to its stability meets usually the requirements on the uncertainty of the measuring instruments easily. ADCs and DACs influence dominantly the accuracy of instruments and limit the signal dynamics and their applicability. An exact error description and standardized testing methods are required by the end user. Moreover, the simplification of the error description by dominant error parameters is a permanent task for the metrologist and producers. This paper is aimed at providing a metrological overview of ADC and DAC topics by referring to their: i) architectures, ii) modelling and testing, and iii) standardization.
PL
Praca stanowi przegląd aktualnego stanu problematyki modelowania i testowania przetworników analogowo-cyfrowych (A/C) i cyfrowo-analogowych (C/A). Przedstawiono w niej modele błędów różnych typów przetworników A/C oraz standardowe i nowe metody testowania przetworników A/C i C/A z uwzględnieniem testów statystycznych i dynamicznych.
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