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2 Optica Applicata

2 2005

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Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes

Ochalski T. J., Piwoński T., Wawer D., Pierściński K., Bugajski M., Kozłowska A., Maląg A., Tomm J. W.

Optica Applicata

2005

Vol. 35, nr 3

479-484

In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.

Analysis of high-power diode laser thermal properties by micro-Raman spectroscopy

Wawer D., Tomm J. W., Pierściński K., Bugajski M.

Optica Applicata

2005

Vol. 35, nr 3

555-560

Spatially resolved micro-Raman measurements have been performed to determine temperature distribution over the facet of high power semiconductor diode lasers. This technique is non-invasive and allows one to study the local temperature on the surface of the mirror of semiconductor diode lasers under normal operating conditions. The micro-Raman measurements can also serve as a calibration of absolute temperature for the other contact-less thermometric methods, e.g., thermoreflectance.