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EN
We have developed a new technique for monitoring the facet heating in semiconductor lasers and for correlating these measurements with the performance and reliability of the device. The method is based on thermoreflectance, which is a modulation technique relying on periodic facet temperature modulation induced by pulsed current supply of the laser. The periodic temperature change of the laser induces variation of the refractive index and consequently modulates the probe beam reflectivity. The technique has a spatial resolution of about 1 m and temperature resolution better than 1 K, and can be used for temperature mapping over a 300 m × 300 m area. It can be applied to any kind of edge emitting lasers or laser bars. The technique is crucial for understanding the thermal behavior of a device.
EN
In the high power semiconductor lasers, the surface of the mirror is the key element of the construction, which has the main impact on the reliability and degradation processes. In the case of lasers fabricated with the use of GaAs compounds the highest power emitted by the structure is limited by the catastrophic optical damage (COD) effect due to increase of temperature on the air-semiconductor edge. The technique which enables examining the temperature distribution on the mirror surface is thermoreflectance. In this paper, we present the technique of temperature mapping on the mirror surface of the high power semiconductor lasers based on the thermoreflectance method.
3
Content available remote High power QW SCH InGaAs/GaAs lasers for 980-nm band
EN
Strained layer InGaAs/GaAs SCH SQW (Separate Confinement Heterostructure Single Quantum Well) lasers were grown by Molecular Beam Epitaxy (MBE). Highly reliable CW (continuous wave) 980-nm, broad contact, pump lasers were fabricated in stripe geometry using Schottky isolation and ridge waveguide construction. Threshold current densities of the order of Jth = 280 A/cm2 (for the resonator length L = 700 [mu]m) and differential efficiency [eta]= 0.40 W/A (41%) from one mirror were obtained. The record wall-plug efficiency for AR/HR coated devices was equal to 54%. Theoretical estimations of above parameters, obtained by numerical modelling of devices were Jth = 210 A/cm and [eta] = 0.47 W / A from one mirror, respectively. Degradation studies revealed that uncoated and AR/HR coated devices did not show any appreciable degradation after 1500 hrs of CW operation at 35°C heat sink temperature at the constant optical power (50 mW) conditions.
4
Content available remote Optical gain saturation effects in InAs/GaAs self-assembled quantum dots
EN
An attempt has been made to understand electronic structure and optical (lasing) properties of self-assembled InAs/GaAs quantum dots (QD) and to describe saturation effects in QD levels population. The new, improved rate equation model has been developed. The impact of carrier relaxation and level depopulation inside quantum dots on lasing properties, in particular on gain depressing, is discusse.
5
Content available remote Strained layer SCH SQW InGaAs/GaAs lasers for 980-nm band
EN
Strained layer InGaAsIGaAs SCH SQW (separate confinement heterostructure single quantum well) lasers were grown by a molecularbeam epitaxy (MBE). Highly reliable CW (continuous wave) 98O-nm. broad contact, pump lasers were fabricated in stripe geometry using Schottky isolation and ridge waveguide construction. Threshold current densities of the order of Jth =280 A/cm² (for the resonator length L = 700 um) and differential efficiency ƞ = 0.40 W/A (41%) from one mirror were obtained. The record wall-plug efficiency for AR/HR coated devices was equal to 54%. Theoretical estimations of above parameters. obtained by numerical modelling of devices were Jth = 210 A/cm² and ƞ = 0.47 W/A from one mirror, respectively. Degradation studies revealed that uncoated and AR/HR coated devices did not show any appreciable degradation after 3000 hr of CW operation at at 35°C heat sink temperature at the constant optical power (50 mW) conditions
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