The electret properties of polyethylene films with 100-200 /xm thickness and nano-dimension inclusions of Si02 are investigated. The comparative study of electret properties of polymer films on the basis of polyethylene with inclusions and without them is carried out. It is stated that the introduction of Si02 into the volume of polymer results in considerable improvement of the electret state stability of polyethylene films. Using the thermally stimulated relaxation of potential method the parameters of the electrically active defects in the polymer with Si02 inclusions are determined.
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