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EN
Precursory stages of failure development in large rock samples were studied and simultaneous observations of the space-time variation of several physical fields were carried out under different stress-strain states. The failure process was studied in detail. A hierarchical structure of discreet rock medium was obtained after loading. It was found that the moisture reduced the rock strength, increased the microcrack distribution and influenced the shape of the failure physical precursors. The rise in temperature up to 400 °C affected the physical precursors at the intermediate and final stages of the failure. Significant variations were detected in the acoustic and electromagnetic emissions. The coalescence criterion was slightly depending on the rock moisture and temperature effect. The possibility of identifying the precursory stage of failure at different strain conditions by means of a complex parameter derived from the convolution of physical recorded data is shown. The obtained results point out the efficiency of the laboratory modelling of seismic processes.
2
Content available remote Effect of temperature on the physical precursors of rock block failure
EN
The influence of temperature (25-400 °C) on the variations of mechanical, acoustic, electric and electromagnetic precursors of rock failure has been shown experimentally. The most significant variations were detected in the principal parameters of the acoustic and electromagnetic emissions whose impulse energy underwent a fast growth. However, the general character of hierarchical evolution stages of micro and macrofailure was practically unchanged. This has been confirmed by the so-called concentration parameter of rupture, which is theoretically calculated and checked in experiments; its space-time variations preceding the occurrence and progression of macrofailure are slightly depending on the rock temperature effect. This has been shown through the convolution of some physical precursors in a complex parameter whose variation showed an approaching of macrofailure, which remains slightly influenced by changes in temperature. Our results are interpreted in relation to physics of superficial earthquakes and precursors.
EN
A simplified MOSFET model is presented in this paper. The performances of the model, UNICELL (Unique Cell Model), are compared to those provided by BSIM3V3 taken as reference, even for very short channel length MOSFET (45 nm). It is shown that using only two UNICELL cells (BICELL) gives a good deal for CAD static and dynamic usage, because of the few number of parameters to be used in comparison to BSIM3. BICELL can also be used for determining internal performance analysis.
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