Wyniki wyszukiwania - BazTech

Ograniczanie wyników

1 Materials Science Poland

1 2007

Znaleziono wyników: 1

Liczba wyników na stronie

Wyniki wyszukiwania

Sortuj według:

Ogranicz wyniki do:

PTFE encapsulation for pentacene based organic thin film transistors

Pannemann C., Diekmann T., Hilleringmann U., Schurmann U., Scharnberg M., Zaporojtchenko V., Adelung R, Faupel F.

Materials Science Poland

2007

Vol. 25, No. 1

95--101

Unprotected organic devices suffer from degradation due to water and oxygen incorporation. To validate the function of organic thin film transistor capsulation, interdigital transistor structures (WIL = 16 830 and WIL = 23 400) were prepared on p-type silicon wafers, and a high current was driven (initially up to -15 mA and -6.8 mA, respectively, at -40VDS, -40V GS) in order to detect their explicit reactions to degradation. Subsequently, the OTFT active layer was encapsulated with 1.5 urn of sputtered polytetrafluoroethylene (PTFE). The degradation experiment for 4 months in dark laboratory conditions revealed reduced degradation compared to earlier experiments using thinner protection films. During the experiment, the threshold voltage shifted in the positive direction, suggesting degradation only due to oxygen. Obviously, degradation due to humidity was blocked, as it would have caused a negative threshold voltage shift.