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EN
Today, the transmission expansion planning for an existing power system under different constraints, is one of the major challenge for power engineers. There are several reasons; one of the reasons is rapid growth in load and inadequate capacity addition. Hence, it is important and essential to implement an algorithm for the transmission expansion which works well and have a good feasibility under certain assumptions and available constraints. Transmission expansion planning used in proposed paper works on an analytical algorithm which has been implemented for specific load condition with variations in generation. For that purpose, an economical factor has been measured that considers economical aspects of the line to be added for expansion. The prescribed analytical approach is also implemented for its feasibility check on a practical case study system.
2
Content available remote Characterization of sol-gel derived Yttrium Doped n-ZnO/p-Si Heterostructure
EN
This paper reports the experimental and theoretical analysis of current-voltage characteristics of n-ZnO/ p-Si (100) heterostructures. The yttrium doped ZnO films have been deposited on p-Si by sol-gel process using spin coating technique. The structural and electrical properties have been studied as a function of annealing temperature. The experimental data have been analyzed by modifying the current voltage relation predicted by Perlman and Feucht. An estimate of the defect density at the ZnO/Si interface has been made using the Mott-Schottky (C-2-U) plots.
EN
Yttrium-doped zinc oxide (YZO) thin films were deposited with the dip coating technique. The effect of different sol-gel stabilizers (lactic acid with hydrolysis, without hydrolysis, and diethanolamine (DEA)) on structural, electrical and optical properties of the produced films were investigated. The stability of solutions prepared with DEA was much higher than that of other stabilizers. Films deposited using this solution also exhibited good adherence to the substrate, preferential orientation, and the lowest full width at half maximum of (002) X-ray diffraction peak. Average transmittance in the visible region increased by 14.6% and resistivity decreased by two orders of magnitude as the stabilizer was changed from lactic acid to DEA. The lowest resistivity, 3.5 ?10-2 źcm, and an average transmittance of 85% are obtained for 200 nm thick films annealed at 450 C in air using DEA as a stabilizer.
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