Wyniki wyszukiwania - BazTech

Ograniczanie wyników

1 International Journal of Microelectronics and Computer Science

1 2012

Znaleziono wyników: 1

Liczba wyników na stronie

Wyniki wyszukiwania

Sortuj według:

Ogranicz wyniki do:

On-chip Parametric Test of R-2R Ladder Digital-to-Analog Converter and Its Efficiency

Arbet D., Stopjakova V., Brenkus J., Gyepes G.

International Journal of Microelectronics and Computer Science

2012

Vol. 3, nr 2

73-80

This paper deals with the investigation of the fault detection in separated parts of a mixed-signal integrated circuit example by implementing parametric test methods. The experimental Circuit Under Test (CUT) consisting of an 8-bit binary-weighted R-2R ladder digital-to-analog converter and additional on-chip test hardware was designed in a standard 0.35 μm CMOS technology. For detection of catastrophic and parametric faults considered in different parts of the CUT, two dedicated parametric test methods: oscillation-based test technique and IDDQ monitoring were used. For the operational amplifier, on-chip and off-chip approaches have been used to compare the efficiency of both approaches in covering catastrophic faults that are hard to detect. For respective converter parts, the excellent fault coverage of 94.21% of hard-detectable faults by the proposed parametric tests was achieved.