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Content available remote Electrical and optical properties of spin-coated SnO2 nanofilms
EN
SnO2 nanocrystalline thin films have been deposited on oxidized silicon substrates by spin-coating from a precursor solution, followed by slow thermal annealing in oxygen atmosphere at different temperatures (500 to 900 °C). The precursor solution consisted of 1.0 to 2.0 M SnCl4•5H2O in isopropanol. It was shown that the concentration of the precursor solution, annealing temperature and heating rate had a significant effect on the structural, optical and electrical properties of the studied thin films. The topography of SnO2 thin films was examined by scanning electron microscopy (SEM). Furthermore, as-deposited films were characterized by X-ray diffraction (XRD), UV-Vis and impedance spectroscopy.
EN
The paper presents the results of investigations involving the influence of aging and annealing of the sol films on the final parameters of the obtained silica films. Both technological process and measurement method were described. The changes of refractive index were presented as well as the changes of film thickness of sols deposited on glass substrates during their aging under ambient conditions. The influence of the annealing process of films on their final parameters was examined. Silica films on glass substrates were deposited using dip coating method.
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