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1 1999

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Superresolution phase image microscope.

Velzel Ch., Masajada J.

Optica Applicata

1999

Vol. 29, nr 3

293-300

While reflecting w wave front from a rough surface we can find areas with multi-valued defined phase (the same phenomena are present when the wave front passes through inhomogeneous or rough object). These regions -singularities - have the specific features and may cause a number of interesting phenomena to occur. We can treat them as well defined physical beings. We can also try to set optical instruments based on the birth, propagation and detection of singularities. One of such instruments under development is superresolution phase image microscope (SUPHIM). In the paper, we present briefly some basic information on singularities. Next, we give some information about SUPHIM. We also show examples of the experimental results that have been taken with SUPHIM working prototype.