Transparent iron-doped titanium oxide thin films were prepared on soda-lime-silica glass substrate from a titanium naphthenate precursor. Films prefired at 500°C for 10 min were finally annealed at 500°C for 30 min in air. Field emission-scanning electron microscope and scanning probe microscope were used for characterizing the surface structure of the film. A sharp absorption edge of the film was observed. The film containing iron showed a shift towards the visible in the absorption threshold.
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