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Recent advancements in the “water-window” microscopy with laser-plasma SXR source based on a double stream gas-puff target

Wachulak P. W.

Opto-Electronics Review

2016

Vol. 24, No. 3

144--154

An overview of our recent developments, regarding “water−window” soft X−ray (SXR) microscopy based on a laser−plasma double stream gas puff target sources is presented. The work, presented herein, describes two approaches to SXR microscopy. The first one is a low spatial resolution, achromatic SXR microscopy, employing Wolter type−I objective. The second one is a nanometer spatial resolution SXR microscopy, with the use of a Fresnel zone plate objective, for imaging various objects with quasimonochromatic light, emitted from a double stream gas puff target based short wavelength source. The developments regarding both systems are presented, as well as the possible applications, for which the SXR microscope was already employed. Such compact, table−top size, laboratory type microscopy setups may be employed in the near future for complementary−like studies to other, often used, microscopy techniques.

Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Torrisi A., Wachulak P., Torrisi L., Bartnik A., Węgrzyński Ł., Fiedorowicz H.

Nukleonika

2016

Vol. 61, No. 2

139--143

An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ = 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.