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An Improvement of CMOS Voltage Reference

Punyawong W., Sa-Ngiamvibool W., Aurasopon A., Hongprasit S.

Przegląd Elektrotechniczny

2013

R. 89, nr 6

109--112

This paper presents a CMOS voltage reference design, which is widely used in electronic circuits, both analog and digital circuits. In the conventional, a CMOS voltage reference circuit design composed of several MOS transistors and complicated circuits, the output voltage cannot be adjusted to any levels. Therefore, in this paper proposed the CMOS voltage reference circuit design technique based on current combination circuit, which it was reduced number of MOS transistors and the proposed circuit is able to operate without complex startup circuit. The performance of the proposed circuit is confirmed through PSPICE simulation results, the circuit can be operated with supply voltage varies from 1.85 - 4 V, the output voltage reference is about 500±2.5 mV at wide temperature range of -58 oC to 120°C, it has very low temperature coefficient of about 61.19 ppm/ °C, and low power dissipation is 5.51 μW.

W artykule opisano ulepszone źródło napięcia wzorcowego w technologii CMOS. W ulepszonej technologii wykorzystuje się mniej tranzystorów a możliwość ustawiania napięcia jest bardziej uniwersalna niż w typowych układach tego typu.

Voltage reference with programmable temperature coefficient and offset voltage compensation

Gruber D., Hilber G., Ostermann T.

International Journal of Microelectronics and Computer Science

2011

Vol. 2, nr 2

73-80

This paper demonstrates an integrated circuit for compensation of errors in voltage references, that not only is able to compensate first order changes of the temperature coefficient, but can also correct for the offset error that is unavoidable in production due to variations in process conditions and mismatches. The temperature compensation circuit is programmable via three control bits, the remaining offset error is compensated by setting eight control bits and an external provided reference voltage. The compensation procedure can be controlled by an internal digital block or via external signals. The actual calibration data can then be saved in several possible ways (EPROM, laser fuses, external Memory, ...). Extensive simulations and measurements show that the described circuit reduces the average temperature error by more than 40% and the overall absolute error by more than 90% wth regards to the uncalibrated reference voltage.