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1 Materials Science

1 2003

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Magnetometry of monoatomic layers and spin electronics elements

Wrona J., Stobiecki T., Czapkiewicz M., Rak R.

Materials Science

2003

Vol. 21, No. 1

55-63

In this paper, two magnetometers: resonance vibrating sample magnetometer (R-VSM) and magnetooptical Kerr effect magnetometer (MOKE) designed for hysteresis loop measurements of ultra-thin films and spintronics elements are described. Both instruments have been built by the first author of this paper in the Department of Electronics. The measuring head of R-VSM is universal and could work in the Helmholtz coils as well as in an electromagnet. The frequency of R-VSM is about 75 Hz. Test measurements on MgO(001)/Fe(4, 3, and 2ML)/50ACr samples were performed and the sensitivity was estimated as 10-5 emu. The MOKE system with differential amplifier (in contrast to lock-in detection technique) is especially recommended for rapid measurements up to 1.5 kHz. The calibration of the Kerr rotation angle was performed on the standard Fe sputtered films (with thickness from 2 nm to 50 nm) and Fe-wedge sample, prepared by MBE-technique, with the range of thickness from 1ML to 50 ML of Fe. On the base of measurement of 2, 3, 4, 5, 7 ML of Fe, the angle resolution of Kerr rotation was estimated as 0.001 min.