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A fault verification method for testing of analogue electronic circuits

Tadeusiewicz M., Hałgas S.

Metrology and Measurement Systems

2018

Vol. 25, nr 2

331-346

The paper deals with multiple soft fault diagnosis of analogue circuits. A method for diagnosis of linear circuits is developed, belonging to the class of the fault verification techniques. The method employs a measurement test performed in the frequency domain, leading to the nonlinear least squares problem. To solve this problem the Powell minimization method is applied. The diagnostic method is adapted to real circumstances, taking into account deviations of fault-free parameters and measurement uncertainty. Two examples of electronic circuits encountered in practice demonstrate that the method is efficient for diagnosis of middle-sized circuits. Although the method is dedicated to linear circuits it can be adapted to multiple soft fault diagnosis of nonlinear ones. It is illustrated by an example of a CMOS circuit designed in a sub-micrometre technology.

A Verification Technique for Multiple Soft Fault Diagnosis of Linear Analog Circuits

Tadeusiewicz M., Ossowski M.

International Journal of Electronics and Telecommunications

2018

Vol. 64, No. 1

83--89

The paper deals with multiple soft fault diagnosis of linear analog circuits. A fault verification method is developed that allows estimating the values of a set of the parameters considered as potentially faulty. The method exploits the transmittance of the circuit and is based on a diagnostic test leading to output signal in discrete form. Applying Z-transform a diagnostic equation is written which is next reproduced. The obtained system of equations consisting of larger number of equations than the number of the parameters is solved using appropriate numerical approach. The method is adapted to real circumstances taking into account scattering of the fault-free parameters within their tolerance ranges and some errors produced by the method. In consequence, the results provided by the method have the form of ranges including the values of the tested parameters. To illustrate the method two examples of real electronic circuits are given.