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PL
W artykule przedstawiono nową, metodę pomiaru lepkości ultracienkich warstw polimerów. Polega ona na zanurzeniu w warstwie drgającej sondy pomiarowej. Na podstawie zmian częstotliwości rezonansowej oraz fazy jej drgań można wyznaczyć wartość lepkości w funkcji głębokości zanurzenia. Grubość najcieńszej przebadanej warstwy wynosiła 30 nm, a dokładność pomiaru lepkości około 10%. Otrzymane wyniki są zgodne z przewidywaniami oraz z wynikami otrzymywanymi innymi metodami. Nowa metoda pomiarowa może być przydatna w rozwoju nowych technologii takich jak proces nanoimprint lithography.
EN
A new method of measurement viscosity of thin polymeric films is presented. The probe, which is placed on the end of the arm of the mini tuning fork (Fig. 2) is made to oscillate and than is put into the PMMA (poly(methyl methacrylate)) films. Because of the rheological properties of measured samples, the amplitude and resonant frequency are changed. Simple mathematical model of probe, which is immersed partially into a liquid and oscillates, was elaborated. Thirteen samples were examined which differed from each other by the thickness of the film and the molecular weight. The thickness of the films is from 30 nm up to 1080 nm (Tab. 1). All measured properties are depended on temperature, thickness of the film, the depth of indentation of the probe and the molecular weight of PMMA. The viscosity is lower in higher temperatures (Fig. 5) but higher with bigger molecular weight (Fig. 6). They are also lower for thicker films. The results gained from this experiment may be useful in development of nanoimprint lithography and many other branches of nanotechnology. What is more, the method gives a possibility of fast and precise measure-ment of rheological properties of many different thin films in function of temperature.
2
Content available remote Study of ultrathin Co films grown on Si(111) substrates
EN
Ultrathin Co films were grown on vicinal Si(111) substrate with Cu buffer layers. Room temperature ferromagnetic behaviour of Co layer thicker than 4 monolayers was confirmed by the magneto-optical Kerr effect. Ferromagnetic resonance measurements have proven the coexistence of the magnetocrystalline anisotropy along with the growth- and vicinal induced uniaxial out-of-plane and in-plane contributions. Multi-jump hysteresis loops were observed for selected in-plane orientations of magnetic field which is explained by the competition of different anisotropy contributions.
3
Content available remote Magnetic properties of ultrathin Co(0001) films on vicinal Si(111) substrate
EN
In the present work we report on magnetization reversal process, anisotropy and domain structures in ultrathin Au/Co(0001)/Au films deposited on vicinal Si(111) substrates. The measurements were performed using a magneto-optical Kerr effect based magnetometer, a polarizing optical microscope and a ferromagnetic resonance spectrometer. Co thickness induced spin-reorientation from out-of-plane into in-plane magnetization was studied. Changes of in-plane magnetic anisotropy symmetry were deduced from shapes of magneto-optical hysteresis loops and from analysis of angular dependences of the resonance field. The experimental data have been discussed taking into account both uniaxial out-of-plane anisotropy and step-induced uniaxial in-plane anisotropy. A preferential orientation of domain walls in 3ML thick Co films was observed. The finding is explained by the step-induced magnetic anisotropy.
EN
Nanoindentation and nanoscratch tests were performed for TiN, CrN, NbN ultrathin films deposited on single crystal silicon wafer to estimate their hardness and elasticity modulus. The results of the investigation were compared with the same studies carried out for the microelectronic dielectric films SiO2 (two types - thermally and plasma deposited) and Si3N4. The demonstrated better mechanical properties of the first group of the films predestinate them to be used as protective films in Micro Electro Mechanical System (MEMS) devices.
PL
Metodą wgniecenia przeprowadzono badania bardzo cienkich warstw TiN, CrN i NbN osadzonych na płytce z krzemu krystalicznego celem oceny ich twardości i modułu sprężystości. Do nanoszenia stosowano technikę PVD. Wyniki tych badań zostały porównane z wynikami podobnych prób dla mikroelektronicznych warstw dielektrycznych SiO2 (dwa rodzaje - osadzane termicznie i plazmowo) oraz Si3N4. Obszerne badania ultracienkich warstw azotków TiN, CrN i NbN wykazały, że najlepszymi własnościami mechanicznymi charakteryzuje się warstwa NbN. Spośród warstw mikroelektronicznych warstwy tlenków mają znacznie gorsze własności niż warstwa azotku krzemu. Własności mechaniczne i zużyciowe warstw wszystkich azotków są lepsze od własności mechanicznych podłoża - krzemu krystalicznego oraz badanych warstw dielektrycznych, więc predystynują je do zastosowania jako warstwy ochronne na elementach mikrosystemów elektromechanicznych (MEMS).
EN
The possibility of fabrication of ultra-thin films of metal hexacyanoferrates, Prussian Blue, PB, and nickel hexacyanoferrate, NiHCNFe, by multiple sequential attachment of metal cations (self-assembled on 4-aminobenzoic acid monolayer) and hexacyanoferrate anions, has been demonstrated. These films can form a bilayer arrangement on glassy carbon when PB and NiHCNFe are deposited as inner and outer films, respectively. To avoid mixing of the NiHCNFe and PB redox sites, we introduce an polymer interlayer from poly(4-vinylpyridine) and Nafion. Since the outer NiHCNFe film is physically separated from the electrode surface, and it undergoes redox reactions at potentials characteristic of the inner PB film, an effect of the reversible charge state trapping (bistable switching) is observed. Astable bilayer structure can also be deposited on stainless steel. The whole concept may be of importance to corrosion protection since charge accumulated in the oxidized bilayer film tends to stabilize corrosion potential within passive range.
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