Wyniki wyszukiwania - BazTech

Ograniczanie wyników

2 Metrology and Measurement Systems

2 2009

Znaleziono wyników: 2

Liczba wyników na stronie

Wyniki wyszukiwania

Wyszukiwano:
w słowach kluczowych: time-interval measuring module

Sortuj według:

Ogranicz wyniki do:

Review of single-stage time-interval measurement modules implemented in FPGA devices

Zieliński M.

Metrology and Measurement Systems

2009

Vol. 16, nr 4

641-647

High resolution Time Interval Measurement Systems [TIMS] can be applied in experimental physics, ultrasonic flow meters, distance meters, or clock period meters. In this paper the problem of single-stage, high resolution TIMS design and implementation in programmable CMOS FPGA devices is discussed. Different architectures of TIMS are compared. Moreover, main parameters of TIMS, such as resolution, double pulse resolution, nonlinearity and sensitivity to temperature fluctuation are also discussed.

Accumulated jitter measurement of standard clock oscillators

Zieliński M., Kowalski M., Frankowski R., Chaberski D., Grzelak S., Wydźgowski L.

Metrology and Measurement Systems

2009

Vol. 16, nr 2

259-266

Long term instability of frequency and phase fluctuations of the clock signal are significant source of the measurement error in the precise time-interval measurement systems. In this paper the problem of clock signal instability, fluctuations caused by accumulated clock jitter and their influence on the precision of the time-interval measurement system implemented in the programmable CMOS FPGA devices are discussed. The presented method enables jitter characterization of the reference-clock. Moreover, the time-interval-error in the range up to several miliseconds can be easily and quickly calculated using only two parameters obtained during the calibration process. The described method can be applied in measurement instruments with a precise time-base.