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Influence of Thermal Phenomena on dc Characteristics of the IGBT

Górecki P., Górecki K.

International Journal of Electronics and Telecommunications

2018

Vol. 64, No. 1

71--76

The paper concerns the study of the effect of thermal phenomena on characteristics of the IGBT. The used measurement set-ups and the results of measurements of dc characteristics of the selected transistor obtained under different cooling conditions are presented. The influence of the ambient temperature and the applied cooling system on the shape of these characteristics is discussed. In particular, attention has been paid to the untypical shape of non-isothermal characteristics of this element in the subthreshold range.