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Performence of multichannel FX chip with DC Coupled Schottky CdTe detector

Kachel M.

Electronics and Telecommunications Quarterly

2008

Vol. 54, No 4

483-492

This paper describes the performance of multichannel ASIC (called FX) which has been connected to Schottky CdTe detector by DC coupling. Because of DC coupling, leakage current of the detector flows into readout electronics and changes its performance. The I-V characteristic of CdTe Schottky detector with guard ring have been measured and we have performed both simulation and experimental verification of FX IC behavior vs. detector leakage current. Due to the low values of this detector leakage current (140 pA for bias voltage of 700 V) performance of FX IC is slightly influenced. Measurements performed with low values of detector's leakage current (below 1 nA), show that the gain of readout channel stays constant with changes of leakage current, while the offset voltage at the discrimonator input changes linearly of about 4.5 mV per 100 pA of the detector leakage current. Limitations of DC coupling method are shown based on measurements with Schottky CdTe detector without guard ring, which produces higer leakage current.