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2 Opto-Electronics Review

2 2004

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Effect of air mass factor on the performance of different type of PV modules

Żdanowicz T., Rodziewicz T., Ząbkowska-Wacławek M.

Opto-Electronics Review

2004

Vol. 12, No. 1

69-73

The paper presents the results of the outdoor performance tests made on several types of commercial PV modules. These were both single crystal and multicrystalline Si modules as well as thin-film CIS and two amorphous Si devices-single junction, marked as SJ, and triple junction, marked as TJ, respectively. Special emphasis has been put on the effects related to actual solar spectrum and meteorological parameters like air humidity and ambient temperature that may influence it. Besides short term changes that could be observed during a single day, also the results collected for more than one year of monitoring are presented. Additionally, the results of some theoretical calculations supplementing the experimental data are given. Performance of thin-film CIS module and both a-Si modules after well visible period of degradation seems to be more affected by weather and climatic conditions than the modules made of crystalline Si cells.

Advanced system for calibration and characterization of solar cells

Granek F., Żdanowicz T.

Opto-Electronics Review

2004

Vol. 12, No. 1

57--67

This paper presents high performance setup developed at the SolarLab to measure current-voltage (I–V) curves of solar cells. The core of a setup is a steady light solar simulator of class A, according to specifications of IEC 60904-9 and ASTM E927 standards. Available range of measurements enables us to characterise not only all kinds of silicon wafer-based solar cells but also thin film cells and minimodules. A lot of effort has been done to make a setup as a powerful tool for advanced research work. For that purpose, such options have been implemented as various algorithms for I–V curve translation to external conditions other than those recorded during measurement or several techniques to determine lumped series resistance of solar cells (in both cases procedures recommended by IEC 60891 standard have been included). Advanced numerical fitting algorithms allow to extract from I–V curves the parameters corresponding to either of three commonly used equivalent diode models of a solar cell. Using an independent microprocessor unit, the temperature of the measuring table may be controlled in the range 0–60 °C due to a system of four Peltier cells attached to its rear side. This allows for routine determination of thermal coefficients of basic cell parameters. The paper discusses also some of elemental random and nonrandom error sources that can be encountered during the standard I–V measurements of a solar cell. The test results of repeatability of measurements, problems related to probe configuration, and heating up of the cells during “light” measurements are presented showing that the developed system can be successfully used both for laboratory work and as a tester on a production line. The system meets all requirements of the IEC 60904-1, IEC 60904-3, and IEC 60904-9 standards.