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A novel method of handling tolerances for analog circuit fault diagnosis based on normal quotient distribution

Ao Y., Shi Y., Zhang W., Li X.

Metrology and Measurement Systems

2012

Vol. 19, nr 4

817-830

While the Slope Fault Model method can solve the soft-fault diagnosis problem in linear analog circuit effectively, the challenging tolerance problem is still unsolved. In this paper, a proposed Normal Quotient Distribution approach was combined with the Slope Fault Model to handle the tolerances problem in soft-fault diagnosis for analog circuit. Firstly, the principle of the Slope Fault Model is presented, and the huge computation of traditional Slope Fault Characteristic set was reduced greatly by the elimination of superfluous features. Several typical tolerance handling methods on the ground of the Slope Fault Model were compared. Then, the approximating distribution function of the Slope Fault Characteristic was deduced and sufficient conditions were given to improve the approximation accuracy. The monotonous and continuous mapping between Normal Quotient Distribution and standard normal distribution was proved. Thus the estimation formulas about the ranges of the Slope Fault Characteristic were deduced. After that, a new test-nodes selection algorithm based on the reduced Slope Fault Characteristic ranges set was designed. Finally, two numerical experiments were done to illustrate the proposed approach and demonstrate its effectiveness.

Soft-fault diagnosis of dynamic circuits

Tadeusiewicz M., Kuczyński A.

Przegląd Elektrotechniczny

2003

R. 79, nr 10

750-753

Praca przedstawia metodykę diagnostyki liniowych i nieliniowych obwodów dynamicznych przy zastosowaniu pojedynczego punktu pomiarowego w obwodzie. Diagnostyka pozwala na identyfikację uszkodzonego elementu jak również na określenie wartości parametru tego elementu. Metoda bazuje na pomiarach wartości chwilowych sygnału w różnych chwilach czasowych w stanie nieustalonym obwodu. Metoda zilustrowana jest dwoma przykładami numerycznymi.

The paper deals with soft-fault diagnosis of linear and nonlinear dynamic circuits with a single test point. The diagnosis includes identification of faulty elements from among a set of testable elements and determination their parameters. A simulation after-test method is developed, based on an appropriate diagnosis equation and measurements carried out on the test point at different points of time during the transient process. The transient and sensitivity analyses are carried out simultaneously leading to a set of sensitivity vectors. They are used to form a rectangular testability matrix included in a diagnostic equation which expresses the node voltage perturbations in terms of the parameter deviations. The number of rows of the testability matrix is larger than the number of columns. Usually, the diagnostic equation cannot be solved uniquely, because some columns of the testability matrix (and corresponding them parameters) form ambiguity groups and some sensitivity values are very small. To identify the testable elements the known method based on QR factorization of the testability matrix can be applied. Next a set of the potentially faulty elements is formed and the modified diagnostic equation is solved leading to the parameter deviations. The method is illustrated using two numerical examples.